The new Beam Halo Monitor for the CMS experiment at the LHC

In the context of increasing beam energy and luminosity of the LHC accelerator at CERN, it will be important to accurately measure the Machine Induced Background. A new monitoring system will be installed in the CMS cavern for measuring the beam background at high radius. This detector, called the Beam Halo Monitor, will provide an online, bunch-by-bunch measurement of background induced by beam halo interactions, separately for each beam. The detector is composed of synthetic quartz Cherenkov radiators, coupled to fast UV sensitive photomultiplier tubes. The directional and fast response of the system allows the discrimination of the background particles from the dominant flux in the cavern induced by pp collision debris, produced within the 25 ns bunch spacing. The readout electronics of this detector will make use of many components developed for the upgrade of the CMS Hadron Calorimeter electronics, with a dedicated firmware and readout adapted to the beam monitoring requirements. The PMT signal will be digitized by a charge integrating ASIC, providing both the signal rise time and the charge integrated over one bunch crossing. The backend electronics will record bunch-by-bunch histograms, which will be published to CMS and the LHC using the newly designed CMS beam instrumentation specific DAQ. A calibration and monitoring system has been designed to generate triggered pulses of UV light to monitor the efficiency of the system. The experimental results validating the design of the detector, the calibration system and the electronics will be presented.

Modelling and Design of Advanced Reliable Circuits and Devices for Energy Efficiency

Reliable electronic systems, namely a set of reliable electronic devices connected to each other and working correctly together for the same functionality, represent an essential ingredient for the large-scale commercial implementation of any technological advancement. Microelectronics technologies and new powerful integrated circuits provide noticeable improvements in performance and cost-effectiveness, and allow introducing electronic systems in increasingly diversified contexts. On the other hand, opening of new fields of application leads to new, unexplored reliability issues. The development of semiconductor device and electrical models (such as the well known SPICE models) able to describe the electrical behavior of devices and circuits, is a useful means to simulate and analyze the functionality of new electronic architectures and new technologies. Moreover, it represents an effective way to point out the reliability issues due to the employment of advanced electronic systems in new application contexts. In this thesis modeling and design of both advanced reliable circuits for general-purpose applications and devices for energy efficiency are considered. More in details, the following activities have been carried out: first, reliability issues in terms of security of standard communication protocols in wireless sensor networks are discussed. A new communication protocol is introduced, allows increasing the network security. Second, a novel scheme for the on-die measurement of either clock jitter or process parameter variations is proposed. The developed scheme can be used for an evaluation of both jitter and process parameter variations at low costs. Then, reliability issues in the field of “energy scavenging systems” have been analyzed. An accurate analysis and modeling of the effects of faults affecting circuit for energy harvesting from mechanical vibrations is performed. Finally, the problem of modeling the electrical and thermal behavior of photovoltaic (PV) cells under hot-spot condition is addressed with the development of an electrical and thermal model.