Prematurità: Interazioni Precoci e Sintomatologia Materna

La prematurità rappresenta un fattore di rischio per la qualità delle interazioni precoci e la sintomatologia materna, soprattutto in caso di nascita VLBW (peso ≤ 1500 grammi) ed ELBW (≤1000 grammi). Scopo dello studio è valutare a 3 e 9 mesi di età corretta le modalità interattive delle diadi madre-bambino e lo stato affettivo materno in due campioni di prematuri, ELBW e VLBW, confrontandoli con un gruppo di bambini nati a termine (GC). Un campione di 119 diadi madre-bambino, di cui 71 nati prematuri (30 VLBW e 21 ELBW) e 68 a termine, sono stati valutati all'età di 3 e 9 mesi. Durante gli assessment, è avvenuta la videoregistrazione dell’interazione madre-bambino, codificata mediante le Global Rating Scales (a 3 mesi) ed il CARE Index Infant (a 9 mesi), e la valutazione della sintomatologia materna, attraverso Edinburgh Postnatal Depression Scale, Penn State Worry Questionnaire, Social Interaction and Anxiety Scale, Social Phobia Scale, Parenting Stress Index-Short Form, Questionari italiani del Temperamento. A 3 mesi, le madri di ELBW appaiono più demanding e meno sensibili rispetto a quelle di VLBW; più intrusive rispetto a quelle di GC. Tali madri, inoltre, sono significativamente meno sensibili di quelle del GC anche a 9 mesi. In entrambi gli assessment, tali madri presentano livelli significativamente maggiori di depressione, ansia generalizzata e stress, rispetto a quelle di entrambi gli altri gruppi. Non emergono differenze rispetto all'ansia sociale nè alla percezione del temperamento. Le analisi della correlazione hanno evidenziato specifiche relazioni tra la sintomatologia materna e i pattern interattivi nei tre gruppi. La nascita pretermine rappresenta un fattore di rischio solo per le madri di ELBW, che presentano difficoltà interattive ed elevata sintomatologia; quelle dei VLBW, infatti, tendono a presentare pattern interattivi affini a quelle del GC, mostrando adeguata sensibilità e bassi livelli di depressione, ansia e stress.

Validation of the CFD code NEPTUNE for a full scale simulator for decay heat removal systems with in-pool heat exchangers

In the present work, a multi physics simulation of an innovative safety system for light water nuclear reactor is performed, with the aim to increase the reliability of its main decay heat removal system. The system studied, denoted by the acronym PERSEO (in Pool Energy Removal System for Emergency Operation) is able to remove the decay power from the primary side of the light water nuclear reactor through a heat suppression pool. The experimental facility, located at SIET laboratories (PIACENZA), is an evolution of the Thermal Valve concept where the triggering valve is installed liquid side, on a line connecting two pools at the bottom. During the normal operation, the valve is closed, while in emergency conditions it opens, the heat exchanger is flooded with consequent heat transfer from the primary side to the pool side. In order to verify the correct system behavior during long term accidental transient, two main experimental PERSEO tests are analyzed. For this purpose, a coupling between the mono dimensional system code CATHARE, which reproduces the system scale behavior, with a three-dimensional CFD code NEPTUNE CFD, allowing a full investigation of the pools and the injector, is implemented. The coupling between the two codes is realized through the boundary conditions. In a first analysis, the facility is simulated by the system code CATHARE V2.5 to validate the results with the experimental data. The comparison of the numerical results obtained shows a different void distribution during the boiling conditions inside the heat suppression pool for the two cases of single nodalization and three volume nodalization scheme of the pool. Finaly, to improve the investigation capability of the void distribution inside the pool and the temperature stratification phenomena below the injector, a two and three dimensional CFD models with a simplified geometry of the system are adopted.

Long-term reliability of power GaN HEMTS

The world is quickly changing, and the field of power electronics assumes a pivotal role in addressing the challenges posed by climate change, global warming, and energy management. The introduction of wide-bandgap semiconductors, particularly gallium nitride (GaN), in contrast to the traditional silicon technology, is leading to lightweight, compact and evermore efficient circuitry. However, GaN technology is not mature yet and still presents reliability issues which constrain its widespread adoption. Therefore, GaN reliability is a hotspot for the research community. Extensive efforts have been directed toward understanding the physical mechanisms underlying the performance and reliability of GaN power devices. The goal of this thesis is to propose a novel in-circuit degradation analysis in order to evaluate the long-term reliability of GaN-based power devices accurately. The in-circuit setup is based on measure-stress-measure methodology where a high-speed synchronous buck converter ensures the stress while the measure is performed by means of full I-V characterizations. The switch from stress mode to characterization mode and vice versa is automatic thanks to electromechanical and solid-state relays controlled by external unit control. Because these relays are located in critical paths of the converter layout, the design has required a comprehensive study of electrical and thermal problems originated by the use of GaN technology. In addition, during the validation phase of the converter, electromagnetic-lumped-element circuit simulations are carried out to monitor the signal integrity and junction temperature of the devices under test. However, the core of this work is the in-circuit reliability analysis conducted with 80 V GaN HEMTs under several operating conditions of the converter in order to figure out the main stressors which contribute to the device's degradation.