X̄ chart with variable sample size and sampling intervals

Recent theoretical studies have shown that the X̄ chart with variable sampling intervals (VSI) and the X̄ chart with variable sample size (VSS) are quicker than the traditional X̄ chart in detecting shifts in the process. This article considers the X̄ chart with variable sample size and sampling intervals (VSSI). It is assumed that the amount of time the process remains in control has exponential distribution. The properties of the VSSI X̄ chart are obtained using Markov chains. The VSSI X̄ chart is even quicker than the VSI or VSS X̄ charts in detecting moderate shifts in the process.

Bivariate control charts with double sampling

In this article, we consider the T(2) chart with double sampling to control bivariate processes (BDS chart). During the first stage of the sampling, n(1) items of the sample are inspected and two quality characteristics (x; y) are measured. If the Hotelling statistic T(1)(2) for the mean vector of (x; y) is less than w, the sampling is interrupted. If the Hotelling statistic T(1)(2) is greater than CL(1), where CL(1) > w, the control chart signals an out-of-control condition. If w < T(1)(2) <= CL(1), the sampling goes on to the second stage, where the remaining n(2) items of the sample are inspected and T(2)(2) for the mean vector of the whole sample is computed. During the second stage of the sampling, the control chart signals an out-of-control condition when the statistic T(2)(2) is larger than CL(2). A comparative study shows that the BDS chart detects process disturbances faster than the standard bivariate T(2) chart and the adaptive bivariate T(2) charts with variable sample size and/or variable sampling interval.

Synthetic control charts with two-stage sampling for monitoring bivariate processes

In this article, we consider the synthetic control chart with two-stage sampling (SyTS chart) to control bivariate processes. During the first stage, one item of the sample is inspected and two correlated quality characteristics (x;y) are measured. If the Hotelling statistic T1 2 for these individual observations of (x;y) is lower than a specified value UCL 1 the sampling is interrupted. Otherwise, the sampling goes on to the second stage, where the remaining items are inspected and the Hotelling statistic T2 2 for the sample means of (x;y) is computed. When the statistic T2 2 is larger than a specified value UCL2, the sample is classified as nonconforming. According to the synthetic control chart procedure, the signal is based on the number of conforming samples between two neighbor nonconforming samples. The proposed chart detects process disturbances faster than the bivariate charts with variable sample size and it is from the practical viewpoint more convenient to administer.

(X)OVER-BAR CHARTS WITH VARIABLE SAMPLE-SIZE

The usual practice in using a control chart to monitor a process is to take samples of size n from the process every h hours This article considers the properties of the XBAR chart when the size of each sample depends on what is observed in the preceding sample. The idea is that the sample should be large if the sample point of the preceding sample is close to but not actually outside the control limits and small if the sample point is close to the target. The properties of the variable sample size (VSS) XBAR chart are obtained using Markov chains. The VSS XBAR chart is substantially quicker than the traditional XBAR chart in detecting moderate shifts in the process.

VSSI (X)over-bar charts with sampling at fixed times

A standard (X) over bar chart for controlling the process mean takes samples of size no at specified, equally-spaced, fixed-time points. This article proposes a modification of the standard (X) over bar chart that allows one to take additional samples, bigger than no, between these fixed times. The additional samples are taken from the process when there is evidence that the process mean moved from target. Following the notation proposed by Reynolds (1996a) and Costs (1997) we shortly call the proposed (X) over bar chart as VSSIFT (X) over bar chart: where VSSIFT means variable sample size and sampling intervals with fixed times. The (X) over bar chart with the VSSIFT feature is easier to be administered than a standard VSSI (X) over bar chart that is not constrained to sample at the specified fixed times. The performances of the charts in detecting process mean shifts are comparable.

A hierarchy of adaptive (X)over-bar control charts

Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)

VSSI X̄ charts with sampling at fixed times

A standard X̄ chart for controlling the process mean takes samples of size n0 at specified, equally-spaced, fixed-time points. This article proposes a modification of the standard X chart that allows one to take additional samples, bigger than n0, between these fixed times. The additional samples are taken from the process when there is evidence that the process mean moved from target. Following the notation proposed by Reynolds (1996a) and Costa (1997) we shortly call the proposed X chart as VSSIFT X chart where VSSIFT means variable sample size and sampling intervals with fixed times. The X chart with the VSSIFT feature is easier to be administered than a standard VSSI X chart that is not constrained to sample at the specified fixed times. The performances of the charts in detecting process mean shifts are comparable. Copyright © 1998 by Marcel Dekker, Inc.

Adaptive control charts for attributes

We develop a general model for adaptive c, np, u and p control charts in which one, two or three design parameters (sample size, sampling interval and control limit width) switch between two values, according to the most recent process information. For a given in-control average sampling rate and a given false alarm rate, the adaptive chart detects changes in the process much faster than a chart with fixed parameters. Moreover, this study also offers general guidance on how to choose an effective design.

Double sampling X̄ control chart for a first order autoregressive process

In this paper we propose the Double Sampling X̄ control chart for monitoring processes in which the observations follow a first order autoregressive model. We consider sampling intervals that are sufficiently long to meet the rational subgroup concept. The Double Sampling X̄ chart is substantially more efficient than the Shewhart chart and the Variable Sample Size chart. To study the properties of these charts we derived closed-form expressions for the average run length (ARL) taking into account the within-subgroup correlation. Numerical results show that this correlation has a significant impact on the chart properties.

Economic design of Shewhart control charts for monitoring autocorrelated data with skip sampling strategies

Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)

Control charts for monitoring the mean vector and the covariance matrix of bivariate processes

In this article, we propose new control charts for monitoring the mean vector and the covariance matrix of bivariate processes. The traditional tools used for this purpose are the T (2) and the |S| charts. However, these charts have two drawbacks: (1) the T (2) and the |S| statistics are not easy to compute, and (2) after a signal, they do not distinguish the variable affected by the assignable cause. As an alternative to (1), we propose the MVMAX chart, which only requires the computation of sample means and sample variances. As an alternative to (2), we propose the joint use of two charts based on the non-central chi-square statistic (NCS statistic), named as the NCS charts. Once the NCS charts signal, the user can immediately identify the out-of-control variable. In general, the synthetic MVMAX chart is faster than the NCS charts and the joint T (2) and |S| charts in signaling processes disturbances.

Estudo das propriedades dos gráficos de controle bivariados com amostragem dupla

Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)

Control charts for individual observations of a bivariate Poisson process

In this paper, three single-control charts are proposed to monitor individual observations of a bivariate Poisson process. The specified false-alarm risk, their control limits, and ARLs were determined to compare their performances for different types and sizes of shifts. In most of the cases, the single charts presented better performance rather than two separate control charts ( one for each quality characteristic). A numerical example illustrates the proposed control charts.

Adaptive control charts: A Markovian approach for processes subject to independent disturbances

Recent studies have shown that adaptive X control charts are quicker than traditional X charts in detecting small to moderate shifts in a process. In this article, we propose a joint statistical design of adaptive X and R charts having all design parameters varying adaptively. The process is subjected to two independent assignable causes. One cause changes the process mean and the other changes the process variance. However, the occurrence of one kind of assignable cause does not preclude the occurrence of the other. It is assumed that the quality characteristic is normally distributed and the time that the process remains in control has exponential distribution. Performance measures of these adaptive control charts are obtained through a Markov chain approach. (c) 2005 Elsevier B.V. All rights reserved.

Joint control charts for monitoring location and dispersion

The T-2 and the generalized variance vertical bar S vertical bar charts are used for monitoring the mean vector and the covariance matrix of multivariate processes. In this article, we propose for bivariate processes the use of the T-2 and the VMAX charts. The points plotted on the VMAX chart correspond to the maximum of the sample variances of the two quality characteristics. The reason to consider the VMAX statistic instead of the generalized variance vertical bar S vertical bar is the user's familiarity with the computation of simple sample variances; we can't say the same with regard to the computation of the generalized variance vertical bar S vertical bar.