The effect of cooling rate during hydrothermal synthesis of ZnO nanorods

Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)

Influence of Hydrothermal Synthesis Conditions and Device Configuration on the Photoresponse of UV Sensors Based on ZnO Nanorods

Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)

CMOS-based active pixel for low-light-level detection: Analysis and measurements

An analysis of the active pixel sensor (APS), considering the doping profiles of the photodiode in an APS fabricated in a 0.18 μm standard CMOS technology, is presented. A simple and accurate model for the junction capacitance of the photodiode is proposed. An analytic expression for the output voltage of the APS obtained with this capacitance model is in good agreement with measurements and is more accurate than the models used previously. A different mode of operation for the APS based on the dc level of the output is suggested. This new mode has better low-light-level sensitivity than the conventional APS operating mode, and it has a slower temporal response to the change of the incident light power. At 1μW/cm2 and lower levels of light, the measured signal-to-noise ratio (SNR) of this new mode is more than 10 dB higher than the SNR of previously reported APS circuits. Also, with an output SNR of about 10 dB, the proposed dc level is capable of detecting light powers as low as 20 nW/cm2, which is about 30 times lower than the light power detected in recent reports by other groups. © 2007 IEEE.

Photodetection with gate-controlled lateral BJTs from standard CMOS technology

The silicon-based gate-controlled lateral bipolar junction transistor (BJT) is a controllable four-terminal photodetector with very high responsivity at low-light intensities. It is a hybrid device composed of a MOSFET, a lateral BJT, and a vertical BJT. Using sufficient gate bias to operate the MOS transistor in inversion mode, the photodetector allows for increasing the photocurrent gain by 106 at low light intensities when the base-emitter voltage is smaller than 0.4 V, and BJT is off. Two operation modes, with constant voltage bias between gate and emitter/source terminals and between gate and base/body terminals, allow for tuning the photoresponse from sublinear to slightly above linear, satisfying the application requirements for wide dynamic range, high-contrast, or linear imaging. MOSFETs from a standard 0.18-μm triple-well complementary-metal oxide semiconductor technology with a width to length ratio of 8 μm /2 μm and a total area of ∼ 500μm2 are used. When using this area, the responsivities are 16-20 kA/W. © 2001-2012 IEEE.

Investigação óptica de pontos quânticos de InAs confinados em poços quânticos de In0,15Ga0,85As

Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)

Síntese de nanofios de óxidos semicondutores para aplicações em dispositivos ópticos e eletrônicos

Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)

Equações de taxa aplicadas na modelagem de dispositivos fotodetectores baseados em poços quânticos

In this work, it is presented a novel method for calculating some intrinsic parameters such as capture mean time, thermic emission mean time, capture probability and noise gain on quantum well infrared photodetectors. Such devices are built by depositing layers of semiconductors of different energy gap, forming quantum wells. The present method uses rate equations to describe the occupation of discrete states of the quantum wells, that together with noise gain equations given in literature, are solved self consistently. The input data of the method is experimental measurement of dark current (current measured with no relevant incident photon) versus applied bias. In order to validate this approach, the values obtained were compared with results from literature

Síntese e caracterização de materiais semicondutores nanoestruturados luminescentes à base de ZnS

Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)