5 resultados para Evaporating

em Repositório Institucional UNESP - Universidade Estadual Paulista "Julio de Mesquita Filho"


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Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)

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The vibrational spectra of palladium phthalocyanine (PdPc) evaporated thin solid films are reported, including the resonance Raman scattering, surface-enhanced resonance Raman scattering (SERRS) and SERRS mapping of the film surface using micro-Raman spectroscopy with 633 nm laser radiation. SERRS of PdPc was obtained by evaporating an overlayer of Ag nanoparticles on to the PdPc film on glass. The SERRS enhancement factor is estimated as similar to10(4) with reference to PdPc evaporated films on glass. The molecular organization of the PdPc evaporated films was probed using transmission and reflection-absorption infrared spectra. It was established that a random molecular distribution found in PdPc evaporated films is independent of temperature. No evidence of thermal degradation due to thermal annealing was found in the films. Electronic absorption and emission spectra are also discussed. Copyright (C) 2002 John Wiley Sons, Ltd.

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A search for microscopic black holes in pp collisions at a center-of-mass energy of 7TeV is presented. The data sample corresponds to an integrated luminosity of 4.7 fb1 recorded by the CMS experiment at the LHC in 2011. Events with large total transverse energy have been analyzed for the presence of multiple energetic jets, leptons, and photons, which are typical signals of evaporating semiclassical and quantum black holes, and string balls. Agreement with the expected standard model backgrounds, which are dominated by QCD multijet production, has been observed for various combined multiplicities of jets and other reconstructed objects in the final state. Model-independent limits are set on new physics processes producing high-multiplicity, energetic final states. In addition, new model-specific indicative limits are set excluding semiclassical and quantum black holes with masses below 3.8 to 5.3TeV and string balls with masses below 4.6 to 4.8TeV . The analysis has a substantially increased sensitivity compared to previous searches.

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This work aims to study the structural characteristics of silica gels obtained from the acid hydrolysis of tetraethoxysilane (TEOS) in water solutions with different concentrations of sodium dodecyl sulfate (SDS). The structural characteristics were studied in stages ranging from the wet gel to the dry stages of the gels (aerogels and xerogels). Aerogels were obtained by ambient pressure drying (APD) after silylation process using trimethylchlorosilane (TMCS) as silylating agent. Xerogels were obtained by conventional evaporating the liquid phase from non silylated gels. The samples were characterized by nitrogen adsorption and small angle X-ray scattering (SAXS). The structure of the wet gels and of the aerogels prepared with the surfactant exhibited characteristics of mass-fractal structures with fractal dimension D in the range 2.1-2.2 for the wet gels and 2.3-2.4 for the aerogels. The characteristic size  of the fractal domain reduces while the size a0 of the primary silica particle composing the fractal structure increases with the drying of the gels, in a process in which share of the porosity is eliminated. Aerogels exhibited typical values for the specific surface of 900 m2g-1 and of 3.5 cm3.g-1 for the total pore volume. These values are correspondingly comparable to those of the aerogels prepared by supercritical drying, since the silylation process replaces hydrophilic –OH groups by hydrophobic –Si-R3 ones, inhibiting the porosity elimination on drying. The silica particle size also increases lightly with the silylation because the attachment of the –Si-R3 groups on the silica surface. The pore size distribution curves of the aerogels are similar for all samples exhibiting a maximum in around 40 nm, independent the concentration of surfactant. This suggests that the characteristic size of 40 nm is due to the association of surfactant micelles... (Complete abstract click electronic access below)