423 resultados para XRD and SEM


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SrBi4Ti4O15 (SBTi) thin films were obtained by the polymeric precursor method and crystallized in a domestic microwave oven. For comparison, films were also crystallized in a conventional furnace at 700 degrees C for 2 h. Structural and morphological characterization of the SBTi thin films was investigated by X-ray diffraction (XRD) and atomic force microscopy (AFM), respectively. Using platinum coated silicon substrates configuration, ferroelectric properties of the films were determined with remanent\polarization P-r and a coercive field E-c of 5.1 mu C/cm(2) and 135 kV/cm for the film thermally treated in the microwave oven and 5.4 mu C/cm(2) and 85 kV/cm for the film thermally treated in conventional furnace, respectively. The films thermally treated in the conventional furnace exhibited excellent fatigue-free characteristics up to 10(10) switching cycles indicating that SBTi thin films can be a promise material for use in non-volatile memories. (C) 2007 Elsevier B.V. All rights reserved.

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In the present work, tellurite 20Li(2)O-80TeO(2) glasses were prepared with identical nominal composition under different glass-forming histories to produce a stressed and stress-free samples. X-ray Diffraction (XRD) and Differential Scanning Calorimetry (DSC) techniques were used to study the effects of the glass-forming histories on the thermal and structural properties of these glasses. The gamma-TeO2 (metastable), alpha-TeO2 and alpha-Li2Te2O5 phases were identified during the controlled devitrification in these glasses. The mestastable character of the gamma-TeO2 phase was clearly observed in the glass under stress but this effect is not so clear in the stress-free glass. The gamma-TeO2 and alpha-TeO2 phases crystallizes during the initial stages of crystallization in both studied glasses while the alpha-Li2Te2O5 phase crystallize in the final stages of the crystallization. The activation energies and Avrami exponent were calculated for both studied glasses with different particle size leading to E-3 > E-2 > E-1 for stressed glass and E-3 > E-2 approximate to E-1 for stress-free glass, where E-1, E-2 and E-3 were associated to the gamma-TeO2, alpha-TeO2 and alpha-Li2Te2O5 phases, respectively. The observed distinct (n) over bar (1) < <(n)over bar>(2) < <(n)over bar>(3) in both glasses is an indicative that nucleation and growth takes place by more than one mechanism in the early stages of the crystallization. (C) 2011 Elsevier B.V. All rights reserved.

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O crescimento da hidroxiapatita - HA, tanto no meio biológico quanto em soluções aquosas como a Synthetic Body Fluid - SBF, ocorre em meio contendo, além dos elementos Ca e P, elementos-traços essenciais tais como: Mg2+, HCO3-, K+ e Na+. Alguns destes elementos são conhecidos como inibidores do crescimento da HA, como Mg2+ e HCO3-. Neste trabalho, estudou-se a influência dos íons K+ e Mg2+ na formação de apatitas sobre substratos metálicos de Ti c.p. previamente tratados com NaOH 5M. Os efeitos destes íons no recobrimento obtidos, antes e após o tratamento térmico a 800ºC, foram analisados por microscopia eletrônica de varredura - MEV, espectroscopia de energia dispersiva de raios-X - EDX, difratometria de raios-X - DRX e espectroscopia no infravermelho - IV e mostraram que o efeito inibitório do Mg2+ na formação da HA se manifesta após o tratamento térmico. Diferentemente, o crescimento cristalino da HA não foi afetado pela presença do íon K+. Além disso, a formação de apatita carbonatada se deu também em soluções que não continham o íon CO3(2-) em sua composição.

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The eutectoid transformation may be defined as a solid-state diffusion-controlled decomposition process of a high-temperature phase into a two-phase lamellar aggregate behind a migrating boundary on cooling below the eutectoid temperature. In substitutional solid solutions, the eutectoid reaction involves diffusion of the solute atoms either through the matrix or along the boundaries or ledges. The effect of Ag on the non-isothermal kinetics of the reverse eutectoid reaction in the Cu-9 mass%Al, Cu-10 mass%Al, and Cu-11 mass%Al alloys were studied using differential scanning calorimetry (DSC), X-ray diffraction (XRD), and scanning electron microscopy (SEM). The activation energy for this reaction was obtained using the Kissinger and Ozawa methods. The results indicated that Ag additions to Cu-Al alloys interfere on the reverse eutectoid reaction, increasing the activation energy values for the Cu-9 mass%Al and Cu-10 mass%Al alloys and decreasing these values for the Cu-11 mass%Al alloy for additions up to 6 mass%Ag. The changes in the activation energy were attributed to changes in the reaction solute and in Ag solubility due to the increase in Al content.

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