130 resultados para Sedimentation and deposition


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The Pantanal wetland is an extensive depositional tract characterized by the presence of fluvial megafans, from which that of the Taquari River is the most extensive and well known. Located on the northern border of the Pantanal, the São Lourenço megafan is a large distributary fluvial system with an area of 16,000 km2, but poorly known regarding its geomorphological and geological features. The Sao Lourenço and the Taquari are coalescent megafans, having the Piquiri interfan meander river in between them. Based on the interpretation of satellite images and field validation, it was possible to identify channel patterns, to interpret depositional and erosional processes, to recognize the phenomena of river avulsion and to map depositional lobes. Three geomorphological zones were recognized on the São Lourenço megafan: 1) abandoned depositional lobes located in the upper/intermediate fan, composed of Pleistocene fluvial deposits and exhibiting distributary paleochannels on their surfaces, which are currently being dissected by tributary channels; 2) an active Holocene confined meander belt formed by fluvial aggradation in a N65E incised-valley; 3) active depositional lobes placed on the distal part of the system, which are the main site of sedimentation and are characterized by frequent avulsion events, channel bifurcation, distributary drainage pattern and the presence of depositional lobated landforms. The active depositional lobes were formed due to an important event of river avulsion that caused the lower portion of the meander belt to be abandoned.

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An a-C:H thin film deposited by plasma immersion ion implantation and deposition on alloy steel (16MnCr5) was analyzed using a self-consistent ion beam analysis technique.In the self-consistent analysis, the results of each individual technique are combined in a unique model, increasing confidence and reducing simulation errors.Self-consistent analysis, then, is able to improve the regular ion beam analysis since several analyses commonly used to process ion beam data still rely on handling each spectrum independently.The sample was analyzed by particle-induced x-ray emission (for trace elements), elastic backscattering spectrometry (for carbon), forward recoil spectrometry (for hydrogen) and Rutherford backscattering spectrometry (for film morphology).The self-consistent analysis provided reliable chemical information about the film, despite its heavy substrate.As a result, we could determine precisely the H/C ratio, contaminant concentration and some morphological characteristics of the film, such as roughness and discontinuities.© 2013 Elsevier B.V.All rights reserved.

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Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)

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Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)

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Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)

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Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)

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Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)

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Pós-graduação em Ciência e Tecnologia de Materiais - FC

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Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)

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Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)

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Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)

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Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)

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Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)