63 resultados para INTERFEROMETRY
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In this work we studied the changes of the optical constants of films in the binary system Sb2O3-Sb2S3 induced by light in the VIS-UV. The measurements were performed before and after homogeneous irradiation of the films to a Hg lamp and in real time during the holographic exposure of the samples (at 458nm). Changes of the absorption coefficient (amplitude grating) and refractive index (phase grating) were measured simultaneously using the self-diffraction using the holographic setup. Besides the films presented a strong photodarkening effect under homogeneous irradiation, the samples holographically exposed presented only refractive index modulations. None amplitude modulation was measured in real time for spatial frequencies of about 1000 l/mm. © 2009 SPIE.
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The aims of this study were to characterize the microstructure of a commercially pure titanium (cpTi) surface etched with HCl/H 2SO 4 (AE-cpTi) and to investigate its in vitro cytocompatibility compared to turned cpTi (T-cpTi). T-cpTi showed a grooved surface and AE-cpTi revealed a surface characterized by the presence of micropits. Surface parameters indicated that the AE-cpTi surface is more isotropic and present a greater area compared to T-cpTi. The oxide film thickness was similar between both surfaces; however, AE-cpTi presented more Ti and O and less C. Osteoblastic cell proliferation, alkaline phosphatase activity, and bone-like nodule formation were greater on T-cpTi than on AE-cpTi. These results show that acid etching treatment produced a surface with different topographical and chemical features compared to the turned one, and such surface modification affected negatively the in vitro cytocompatibility of cpTi as demonstrated by decreasing culture growth and expression of osteoblastic phenotype.
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Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)
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Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)
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Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)
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Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)
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Pós-graduação em Engenharia Elétrica - FEIS
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Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)
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Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)
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Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)
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Pós-graduação em Ciência dos Materiais - FEIS
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Pós-graduação em Odontologia - FOAR
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Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)
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Pós-graduação em Engenharia Elétrica - FEIS
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Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)