226 resultados para tellurite glasses


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Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)

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In the present work, tellurite 20Li(2)O-80TeO(2) glasses were prepared with identical nominal composition under different glass-forming histories to produce a stressed and stress-free samples. X-ray Diffraction (XRD) and Differential Scanning Calorimetry (DSC) techniques were used to study the effects of the glass-forming histories on the thermal and structural properties of these glasses. The gamma-TeO2 (metastable), alpha-TeO2 and alpha-Li2Te2O5 phases were identified during the controlled devitrification in these glasses. The mestastable character of the gamma-TeO2 phase was clearly observed in the glass under stress but this effect is not so clear in the stress-free glass. The gamma-TeO2 and alpha-TeO2 phases crystallizes during the initial stages of crystallization in both studied glasses while the alpha-Li2Te2O5 phase crystallize in the final stages of the crystallization. The activation energies and Avrami exponent were calculated for both studied glasses with different particle size leading to E-3 > E-2 > E-1 for stressed glass and E-3 > E-2 approximate to E-1 for stress-free glass, where E-1, E-2 and E-3 were associated to the gamma-TeO2, alpha-TeO2 and alpha-Li2Te2O5 phases, respectively. The observed distinct (n) over bar (1) < <(n)over bar>(2) < <(n)over bar>(3) in both glasses is an indicative that nucleation and growth takes place by more than one mechanism in the early stages of the crystallization. (C) 2011 Elsevier B.V. All rights reserved.

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Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)

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Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)

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Pós-graduação em Ciência dos Materiais - FEIS

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Pós-graduação em Ciência dos Materiais - FEIS

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Pós-graduação em Ciência dos Materiais - FEIS

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Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)

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Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)

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Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)

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Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)

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Pós-graduação em Ciência dos Materiais - FEIS

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Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)

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Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)

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We report, for the first time to our knowledge, experimental results on pedestal waveguides produced with Yb3+/Er3+ codoped Bi2O3-WO3-TeO2 thin films deposited by RF Sputtering for photonic applications. Thin films were deposited using Ar/O-2 plasma at 5 mTorr pressure and RF power of 40 W on substrates of silicon wafers. The definition of the pedestal waveguide structure was made using conventional optical lithography followed by plasma etching. Propagation losses around 2.0 dB/cm and 2.5 dB/cm were obtained at 633 and 1050 nm, respectively, for waveguides in the 20-100 mu m width range. Single-mode propagation was measured for waveguides width up to 10 mu m and 12 mu m, at 633 nm and 1050 nm, respectively; for larger waveguides widths multi-mode propagation was obtained. Internal gain of 5.6 dB at 1530 nm, under 980 nm excitation, was measured for 1.5 cm waveguide length (similar to 3.7 dB/cm). The present results show the possibility of using Yb3+/Er3+ codoped Bi2O3-WO3-TeO2 pedestal waveguide for optical amplifiers. (C) 2014 Elsevier B.V. All rights reserved.