95 resultados para robust mean
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Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)
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Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)
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Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)
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In the present work, we quantify the fraction of trajectories that reach a specific region of the phase space when we vary a control parameter using two symplectic maps: one non-twist and another one twist. The two maps were studied with and without a robust torus. We compare the obtained patterns and we identify the effect of the robust torus on the dynamical transport. We show that the effect of meandering-like barriers loses importance in blocking the radial transport when the robust torus is present.
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In the present work, we determine the fraction of magnetic field lines that reach the tokamak wall leaving the plasma surrounded by a chaotic layer created by resonant perturbations at the plasma edge. The chaotic layer arises in a scenario where an integrable magnetic field with reversed magnetic shear is perturbed by an ergodic magnetic limiter. For each considered line, we calculate its connection length, i.e. the number of toroidal turns that the field lines complete before reaching the wall. We represent the results in the poloidal section in which the initial coordinates are chosen. We also estimate the radial profile of the fraction of field lines, for different temperatures, whose connection lengths are smaller than the electron collisional mean free path.
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Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)
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Este artigo considera um gráfico np x proposto por Wu et al. (2009) para controle de média de processo como uma alternativa ao uso do gráfico de. O que distingue do gráfico de controle np x é o fato das unidades amostrais serem classificadas como unidades de primeiro ou de segunda classe de acordo com seus limites discriminantes. O gráfico tradicional np é um caso particular do gráfico np x quando os limites discriminantes coincidem com os limites de especificação e unidade de primeira (segunda) classe é um item conforme (não conforme). Estendendo o trabalho de Reynolds Junior, Arnold e Baik (1996), consideramos que a média de processo oscila mesmo na ausência de alguma causa especial. As propriedades de Cadeia de Markov foram adotadas para avaliar o desempenho do gráfico np x no monitoramento de média de processos que oscila. de modo geral, o gráfico np x requer amostras duas vezes maior para superar desempenho do gráfico (enquanto que o gráfico tradicional np necessita tamanho de amostras cinco ou seis vezes maior).
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Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)
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Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)
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1/N(c) expansion in QCD (with N(c) the number of colors) suggests using a potential from meson sector (e.g., Richardson) for baryons. For light quarks a sigma-field has to be introduced to ensure chiral symmetry breaking (chi-SB). It is found that nuclear matter properties can be used to pin down the chi-SB modeling. All masses, M(N), m-sigma, m-omega, are found to scale with density. The equations are solved self-consistently.
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A new concept of fault detection and isolation using robust observation for systems with random noises is presented. The method selects the parameters from components that may fault during the process and constructs well conditioned robust observers, considering sensors faults. To isolate component failures via robust observation, a bank of detection observers is constructed, where each observer is only sensitive to one specified component failure while robust to all other component failures.
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Traditionally, an (X) over bar chart is used to control the process mean and an R chart is used to control the process variance. However, these charts are not sensitive to small changes in the process parameters. The adaptive ($) over bar and R charts might be considered if the aim is to detect small disturbances. Due to the statistical character of the joint (X) over bar and R charts with fixed or adaptive parameters, they are not reliable in identifing the nature of the disturbance, whether it is one that shifts the process mean, increases the process variance, or leads to a combination of both effects. In practice, the speed with which the control charts detect process changes may be more important than their ability in identifying the nature of the change. Under these circumstances, it seems to be advantageous to consider a single chart, based on only one statistic, to simultaneously monitor the process mean and variance. In this paper, we propose the adaptive non-central chi-square statistic chart. This new chart is more effective than the adaptive (X) over bar and R charts in detecting disturbances that shift the process mean, increase the process variance, or lead to a combination of both effects. Copyright (c) 2006 John Wiley & Sons, Ltd.
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In this article, we consider the synthetic control chart with two-stage sampling (SyTS chart) to control the process mean and variance. During the first stage, one item of the sample is inspected; if its value X, is close to the target value of the process mean, then the sampling is interrupted. Otherwise, the sampling goes on to the second stage, where the remaining items are inspected and the statistic T = Sigma [x(i) - mu(0) + xi sigma(0)](2) is computed taking into account all items of the sample. The design parameter is function of X-1. When the statistic T is larger than a specified value, the sample is classified as nonconforming. According to the synthetic procedure, the signal is based on Conforming Run Length (CRL). The CRL is the number of samples taken from the process since the previous nonconforming sample until the occurrence of the next nonconforming sample. If the CRL is sufficiently small, then a signal is generated. A comparative study shows that the SyTS chart and the joint X and S charts with double sampling are very similar in performance. However, from the practical viewpoint, the SyTS chart is more convenient to administer than the joint charts.
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A standard X chart for controlling a process takes regular individual observations, for instance every half hour. This article proposes a modification of the X chart that allows one to take supplementary samples. The supplementary sample is taken (and the (X) over bar and R values computed) when the current value of X falls outside the control limits. With the supplementary sample, the signal of out-of-control is given by an (X) over bar value outside the (X) over bar chart's control limits or an R value outside the R chart's control limit. The proposed chart is designed to hold the supplementary sample frequency, during the in-control period, as low as 5% or less. In this context, the practitioner might prefer to verify an out-of-control condition by simply comparing the (X) over bar and R values with the control limits. In other words, without plotting the (X) over bar and R points. The X chart with supplementary samples has two major advantages when compared with the standard (X) over bar and A charts: (a) the user will be plotting X values instead of (X) over bar and R values; (b) the shifts in the process mean and/or changes in the process variance are detected faster.
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We investigate a dilute mixture of bosons and spin-polarized fermions in one dimension. With an attractive Bose-Fermi scattering length the ground state is a self-bound droplet, i.e., a Bose-Fermi bright soliton where the Bose and Fermi clouds are superimposed. We find that the quantum fluctuations stabilize the Bose-Fermi soliton such that the one-dimensional bright soliton exists for any finite attractive Bose-Fermi scattering length. We study density profile and collective excitations of the atomic bright soliton showing that they depend on the bosonic regime involved: mean-field or Tonks-Girardeau.