5 resultados para reflection coefficients
em Universidade Federal do Rio Grande do Norte(UFRN)
Resumo:
In this work, the transmission line method is explored on the study of the propagation phenomenon in nonhomogeneous walls with finite thickness. It is evaluated the efficiency and applicability of the method, considering materials like gypsum, wood and brick, found in the composition of the structures of walls in question. The results obtained in this work are compared to those available in the literature, for several particular cases. A good agreement is observed, showing that the performed analysis is accurate and efficient in modeling, for instance, the wave propagation through building walls and integrated circuit layers in mobile communication and radar system applications. Later, simulations of resistive sheets devices such as Salisbury screens and Jaumann absorbers and of transmission lines made of metal-insulator-semiconductor (MIS) are made. Thereafter, it is described a study on frequency surface selective structures (FSS). It is proposed the development of devices and microwave integrated circuits (MIC) of such structures, for the accomplishment of experiments. Finally, future works are suggested, for instance, on the development of reflectarrays, frequency selective surfaces with dissimilar elements, and coupled frequency selective surfaces with elements located on different layers
Resumo:
This work consists in the development of a theoretical and numerical analysis for frequency selective surfaces (FSS) structures with conducting patch elements, such as rectangular patches, thin dipoles and cross dipoles, on anisotropic dielectric substrates. The analysis is developed for millimeter wave band applications. The analytical formulation is developed in the spectral domain, by using a rigorous technique known as equivalent transmission line method, or immitance approach. The numerical analysis is completed through the use of the Galerkin's technique in the Fourier transform domain, using entire-domain basis functions. In the last decades, several sophisticated analytical techniques have been developed for FSS structure applications. Within these applications, it can be emphasized the use of FSS structures on reflecting antennas and bandpass radomes. In the analysis, the scattered fields of the FSS geometry are related to the surface induced currents on the conducting patches. After the formulation of the scattering problem, the numerical solution is obtained by using the moment method. The choice of the basis functions plays a very important role in the numerical efficiency of the numerical method, once they should provide a very good approximation to the real current distributions on the FSS analyzed structure. Thereafter, the dyadic Green's function components are obtained in order to evaluate the basis functions unknown coefficients. To accomplish that, the Galerkin's numerical technique is used. Completing the formulation, the incident fields are determined through the incident potential, and as a consequence the FSS transmission and reflection characteristics are determined, as function of the resonant frequency and structural parameters. The main objective of this work was to analyze FSS structures with conducting patch elements, such as thin dipoles, cross dipoles and rectangular patches, on anisotropic dielectric substrates, for high frequency applications. Therefore, numerical results for the FSS structure main characteristics were obtained in the millimeter wave bando Some of these FSS characteristics are the resonant
Resumo:
This work presents a theoretical analysis and numerical and experimental results of the scattering characteristics of frequency selective surfaces, using elements of type patch perfectly conductor. The structures are composed of two frequency selective surfaces on isotropic dielectric substrates cascaded, separated by a layer of air. The analysis is performed using the method of equivalent transmission line in combination with the Galerkin method, to determine the transmission and reflection characteristics of the structures analyzed. Specifically, the analysis uses the impedance method, which models the structure by an equivalent circuit, and applies the theory of transmission lines to determine the dyadic Green's function for the cascade structure. This function relates the incident field and surface current densities. These fields are determined algebraically by means of potential incidents and the imposition of the continuity of the fields in the dielectric interfaces. The Galerkin method is applied to the numerical determination of the unknown weight coefficients and hence the unknown densities of surface currents, which are expanded in terms of known basis functions multiplied by these weight coefficients. From the determination of these functions, it becomes possible to obtain numerical scattered fields at the top and bottom of the structures and characteristics of transmission and reflection of these structures. At work, we present numerical and experimental results for the characteristics of transmission and reflection. Comparisons were made with other results presented in literature, and it was observed a good agreement in the cases presented suggestions continuity of the work are presented
Resumo:
Recently, an amazing development has been observed in telecommunication systems. Two good examples of this development are observed in mobile communication and aerospace systems. This impressive development is related to the increasing need for receiving and transmitting communication signals. Particularly, this development has required the study of new antennas and filters. This work presents a fullwave analysis of reflectarrays. The considered structures are composed by arrays of rectangular conducting patches printed on multilayer dieletric substrates, that are mounted on a ground plane. The analysis is developed in the spectral domain, using an equivalent transmission line method in combination with Galerkin method. Results for the reflection coefficient of these structures are presented and compared to those available in the literature. A good agreement was observed. Particularly, the developed analysis uses the transmission lines theory in combination with the incident potentials and the field continuity equations, at the structures interfaces, for obtaining the scattered field components expressions as function of the patch surface currents and of the incident field. Galerkin method is used to determine the unknown coefficients in the boundary value problem. Curves for the reflection coefficient of several reflectarray geometries are presented as function of frequency and of the structural parameters
Análise espectral de reflectarrays com substrato de duas camadas dielétricas anisotrópicas uniaxiais
Resumo:
Recently, an amazing development has been observed in telecommunication systems. Two good examples of this development are observed in mobile communication and aerospace systems. This impressive development is related to the increasing need for receiving and transmitting communication signals. Particularly, this development has required the study of new antennas and filters. This work presents a fullwave analysis of reflectarrays. The considered structures are composed by arrays of rectangular conducting patches printed on multilayer dieletric substrates, that are mounted on a ground plane. The analysis is developed in the spectral domain, using an equivalent transmission line method in combination with Galerkin method. Results for the reflection coefficient of these structures are presented and compared to those available in the literature. A good agreement was observed. Particularly, the developed analysis uses the transmission lines theory in combination with the incident potentials and the field continuity equations, at the structures interfaces, for obtaining the scattered field components expressions as function of the patch surface currents and of the incident field. Galerkin method is used to determine the unknown coefficients in the boundary value problem. Curves for the reflection coefficient of several reflectarray geometries are presented as function of frequency and of the structural parameters