3 resultados para reflection coefficient

em Universidade Federal do Rio Grande do Norte(UFRN)


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The present work deals with the ana1ysis of microstrip patch antennas printed on tapered dielectric substrates. We investigate the influence ofthe substrate height variations on the properties of configurations such as microstrip patch antennas, microstrip patch antennas with overlay and suspendeô microstrip patch antennas. The dielectric substrates can be isotropic or anisotropic ones. This accurate analysis is based on the full-wave formulation. It is carried out initially for the determination of the impedance matrix, through the use of the spectral¬domain immitance approach. We use a model based on a segmentation of the considered line into uniform microstrip line subsections. Normalized phase constants and characteristic impedances are obtained by means of the Galerkin numerical technique. Then, the cascaded combination of the uniform microstrip subsections are analyzed through an interactive procedure. Numerical results are presented for the input reflection coefficient, voltage standing wave ratio, resonant frequency, and radiation pattems ofthe E_plane and H-plane diagrams. It is found that the variations in the substrate height profile produce a great influence on the bandwidth of microstrip antennas. This procedure gives bandwidth improvements without altering considerably the resonant frequency. Furthermore, the tapered microstrip antenna can be used as a lightweight altemative for bandwidth control and to eXtend the use of microstiip antenna technology to a wider variety of applications. Finally, suggestions for the continuity of this work are presented

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Recently, an amazing development has been observed in telecommunication systems. Two good examples of this development are observed in mobile communication and aerospace systems. This impressive development is related to the increasing need for receiving and transmitting communication signals. Particularly, this development has required the study of new antennas and filters. This work presents a fullwave analysis of reflectarrays. The considered structures are composed by arrays of rectangular conducting patches printed on multilayer dieletric substrates, that are mounted on a ground plane. The analysis is developed in the spectral domain, using an equivalent transmission line method in combination with Galerkin method. Results for the reflection coefficient of these structures are presented and compared to those available in the literature. A good agreement was observed. Particularly, the developed analysis uses the transmission lines theory in combination with the incident potentials and the field continuity equations, at the structures interfaces, for obtaining the scattered field components expressions as function of the patch surface currents and of the incident field. Galerkin method is used to determine the unknown coefficients in the boundary value problem. Curves for the reflection coefficient of several reflectarray geometries are presented as function of frequency and of the structural parameters

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Resumo:

Recently, an amazing development has been observed in telecommunication systems. Two good examples of this development are observed in mobile communication and aerospace systems. This impressive development is related to the increasing need for receiving and transmitting communication signals. Particularly, this development has required the study of new antennas and filters. This work presents a fullwave analysis of reflectarrays. The considered structures are composed by arrays of rectangular conducting patches printed on multilayer dieletric substrates, that are mounted on a ground plane. The analysis is developed in the spectral domain, using an equivalent transmission line method in combination with Galerkin method. Results for the reflection coefficient of these structures are presented and compared to those available in the literature. A good agreement was observed. Particularly, the developed analysis uses the transmission lines theory in combination with the incident potentials and the field continuity equations, at the structures interfaces, for obtaining the scattered field components expressions as function of the patch surface currents and of the incident field. Galerkin method is used to determine the unknown coefficients in the boundary value problem. Curves for the reflection coefficient of several reflectarray geometries are presented as function of frequency and of the structural parameters