6 resultados para defects in silicon
em Universidade Federal do Rio Grande do Norte(UFRN)
Resumo:
Radial glial cells (RGCs) in the ventricular neuroepithelium of the dorsal telencephalon are the progenitor cells for neocortical projection neurons and astrocytes. Here we showthatthe adherens junction proteins afadin and CDH2 are criticalforthe control of cell proliferation in the dorsal telencephalon and for the formation of its normal laminar structure. Inactivation of afadin or CDH2 in the dorsal telenceph-alon leads to a phenotype resembling subcortical band heterotopia, also known as “double cortex,” a brain malformation in which heterotopic gray matter is interposed between zones of white matter. Adherens junctions between RGCs are disrupted in the mutants, progenitor cells are widely dispersed throughout the developing neocortex, and their proliferation is dramatically increased. Major subtypes of neocortical projection neurons are generated, but their integration into cell layers is disrupted. Our findings suggest that defects in adherens junctions components in mice massively affects progenitor cell proliferation and leads to a double cortex-like phenotype.
Resumo:
Radial glial cells (RGCs) in the ventricular neuroepithelium of the dorsal telencephalon are the progenitor cells for neocortical projection neurons and astrocytes. Here we showthatthe adherens junction proteins afadin and CDH2 are criticalforthe control of cell proliferation in the dorsal telencephalon and for the formation of its normal laminar structure. Inactivation of afadin or CDH2 in the dorsal telenceph-alon leads to a phenotype resembling subcortical band heterotopia, also known as “double cortex,” a brain malformation in which heterotopic gray matter is interposed between zones of white matter. Adherens junctions between RGCs are disrupted in the mutants, progenitor cells are widely dispersed throughout the developing neocortex, and their proliferation is dramatically increased. Major subtypes of neocortical projection neurons are generated, but their integration into cell layers is disrupted. Our findings suggest that defects in adherens junctions components in mice massively affects progenitor cell proliferation and leads to a double cortex-like phenotype.
Resumo:
Recent years have seen a significant growth in surface modifications in titanium implants, resulting in shorter healing times in regions with low bone density. Among the different techniques, subtraction by chemical agents to increase oxidation has been applied for surface treatment of dental implants. However, this technique is generally unable to remove undesirable oxides, formed spontaneously during machining of titanium parts, raising costs due to additional decontamination stages. In order to solve this problem, the present study used plasma as an energy source to both remove these oxides and oxidize the titanium surface. In this respect, Ti disks were treated by hollow cathode discharge, using a variable DC power supply and vacuum system. Samples were previously submitted to a cleaning process using an atmosphere of Ar, H2 and a mixture of both, for 20 and 60 min. The most efficient cleaning condition was used for oxidation in a mixture of argon (60%) and oxygen (40%) until reaching a pressure of 2.2 mbar for 60 min at 500°C. Surfaces were characterized by scanning electron microscopy (SEM), X-ray diffraction (XRD), atomic force microscopy (AFM), adhesion and cell proliferation. SEM showed less cell spreading and a larger number of projections orfilopodia in the treated samples compared to the control sample. AFM revealed surface defects in the treated samples, with varied geometry between peaks and valleys. Biological assays showed no significant difference in cell adhesion between treated surfaces and the control. With respect to cell proliferation, the treated surface exhibited improved performance when compared to the control sample. We concluded that the process was efficient in removing primary oxides as well as in oxidizing titanium surfaces
Resumo:
This work consists of the creation of a Specialist System which utilizes production rules to detect inadequacies in the command circuits of an operation system and commands of electric engines known as Direct Start. Jointly, three other modules are developed: one for the simulation of the commands diagram, one for the simulation of faults and another one for the correction of defects in the diagram, with the objective of making it possible to train the professionals aiming a better qualification for the operation and maintenance. The development is carried through in such a way that the structure of the task allows the extending of the system and a succeeding promotion of other bigger and more complex typical systems. The computational environment LabView is employed to enable the system
Resumo:
In general, the designs of equipment takes into account the effects and processes of deterioration it will undergo and arrives at an approximate useful life. However, changes in operational processes and parameters, the action of external agents, the kind of maintenance conducted, the means of monitoring, and natural and accidental occurrences completely modify the desired performance of the equipment. The discontinuities that occur in anisotropic materials often and due to different factors evolve from being subcritical to critical acquiring the status of defect and compromising the physical integrity of the equipment. Increasingly sophisticated technological means of detection, monitoring and assessment of these discontinuities are required to respond ever more rapidly to the requirements of industry. This paper therefore presents a VPS (Virtual Pipe System) computational tool which uses the results of ultrasonic tests on equipment, plotting the discontinuities found in models created in the CAD and CAE systems, and then simulates the behavior of these defects in the structure to give an instantaneous view of the final behavior. This paper also presents an alternative method of conventional ultrasonic testing which correlates the integrity of an overlay (carbon steel and stainless steel attached by welding) and the reflection of ultrasonic waves coming from the interface between the two metals, thus making it possible to identify cracks in the casing and a shift of the overlay
Resumo:
Through the adoption of the software product line (SPL) approach, several benefits are achieved when compared to the conventional development processes that are based on creating a single software system at a time. The process of developing a SPL differs from traditional software construction, since it has two essential phases: the domain engineering - when common and variables elements of the SPL are defined and implemented; and the application engineering - when one or more applications (specific products) are derived from the reuse of artifacts created in the domain engineering. The test activity is also fundamental and aims to detect defects in the artifacts produced in SPL development. However, the characteristics of an SPL bring new challenges to this activity that must be considered. Several approaches have been recently proposed for the testing process of product lines, but they have been shown limited and have only provided general guidelines. In addition, there is also a lack of tools to support the variability management and customization of automated case tests for SPLs. In this context, this dissertation has the goal of proposing a systematic approach to software product line testing. The approach offers: (i) automated SPL test strategies to be applied in the domain and application engineering, (ii) explicit guidelines to support the implementation and reuse of automated test cases at the unit, integration and system levels in domain and application engineering; and (iii) tooling support for automating the variability management and customization of test cases. The approach is evaluated through its application in a software product line for web systems. The results of this work have shown that the proposed approach can help the developers to deal with the challenges imposed by the characteristics of SPLs during the testing process