2 resultados para defects in silicon
em Dalarna University College Electronic Archive
Resumo:
Defects are often present in rolled products, such as wire rod. The markets demand for wire rod without any defects has increased. In the final wire rod products, defects originating from the steel making, casting, pre-rolling of billets and during the wire rod rolling can appear. In this work, artificial V-shaped longitudinal surface cracks has been analysed experimentally and by means of FEM. The results indicate that the experiments and FEM calculations show the same tendency except in two cases, where instability due to a fairly “round” false round bars disturbed the experiment. FE studies in combination with practical experiments are necessary in order to understand the behaviour of the material flows in the groove and to explain whether the crack will open up as a V-shape or if it will be closed as an I-shape.
Resumo:
Today there are many system development projects that break both budget and time plan. Often this depends on defects in the information systems that could have been prevented. The cost of test can in some cases be as high as 50 % of the projects total cost and it's at the same time an important part of development. Test as such has moved its focus from the software it self and its faults to a wider perspective on whole infrastructures of information systems where assure a good quality is important. Sogeti in the Netherlands have developed a test method called TMap (Test Management approach) that can be used for structured testing of information systems. TMap haven't been used as much as desired in the office in Borlänge. Because Microsoft is releasing a new version of their platform Visual Studio Team System (VSTS 2010) some colleges at Sogeti in the Netherlands are about to develop a template that can support the use of TMap in VSTS 2010. When we write this the template is still in development. The goal for Sogeti was to find out the differences between the test functionality in VSTS 2008 and 2010. By using the purpose with this essay, which was to analyze the test process in VSTS 2008 with TMap against the test process in VSTS 2010 together with the template we got much help to achieve the goal. The analysis was done with four different aspects: The TPI and TMMi models, problem and strength analyses and a few question formulations. The TPI and TMMi models where used to analyses and evaluate the test process. The analysis showed that there were differences between the both test processes. VSTS 2010 together with the template gave a better support to use TMap and perform test. In VSTS 2010 the test tool Camano is connected to TFS and the tool is also to make the execution and logging of tests easier. This leads to a test process that is easier to handle and has a better support for TMap.