A new micro-machined millimeter-wave and terahertz snap-together rectangular waveguide technology

A novel technique for micro-machining millimeter and submillimeter-wave rectangular waveguide components is reported. These are fabricated in two halves which simply snap together, utilizing locating pins and holes, and are physically robust, and cheap, and easy to manufacture. In addition, S-parameter measurements on these structures are reported for the first time and display lower loss than previously reported micro-machined rectangular waveguides.

The effects of variation in snow properties on passive microwave snow mass estimation

Estimating snow mass at continental scales is difficult, but important for understanding land-atmosphere interactions, biogeochemical cycles and the hydrology of the Northern latitudes. Remote sensing provides the only consistent global observations, butwith unknown errors. Wetest the theoretical performance of the Chang algorithm for estimating snow mass from passive microwave measurements using the Helsinki University of Technology (HUT) snow microwave emission model. The algorithm's dependence upon assumptions of fixed and uniform snow density and grainsize is determined, and measurements of these properties made at the Cold Land Processes Experiment (CLPX) Colorado field site in 2002–2003 used to quantify the retrieval errors caused by differences between the algorithm assumptions and measurements. Deviation from the Chang algorithm snow density and grainsize assumptions gives rise to an error of a factor of between two and three in calculating snow mass. The possibility that the algorithm performsmore accurately over large areas than at points is tested by simulating emission from a 25 km diameter area of snow with a distribution of properties derived from the snow pitmeasurements, using the Chang algorithm to calculate mean snow-mass from the simulated emission. The snowmass estimation froma site exhibiting the heterogeneity of the CLPX Colorado site proves onlymarginally different than that from a similarly-simulated homogeneous site. The estimation accuracy predictions are tested using the CLPX field measurements of snow mass, and simultaneous SSM/I and AMSR-E measurements.

Global snow mass measurements and the effect of stratigraphic detail on inversion of microwave brightness temperatures

Snow provides large seasonal storage of freshwater, and information about the distribution of snow mass as Snow Water Equivalent (SWE) is important for hydrological planning and detecting climate change impacts. Large regional disagreements remain between estimates from reanalyses, remote sensing and modelling. Assimilating passive microwave information improves SWE estimates in many regions but the assimilation must account for how microwave scattering depends on snow stratigraphy. Physical snow models can estimate snow stratigraphy, but users must consider the computational expense of model complexity versus acceptable errors. Using data from the National Aeronautics and Space Administration Cold Land Processes Experiment (NASA CLPX) and the Helsinki University of Technology (HUT) microwave emission model of layered snowpacks, it is shown that simulations of the brightness temperature difference between 19 GHz and 37 GHz vertically polarised microwaves are consistent with Advanced Microwave Scanning Radiometer-Earth Observing System (AMSR-E) and Special Sensor Microwave Imager (SSM/I) retrievals once known stratigraphic information is used. Simulated brightness temperature differences for an individual snow profile depend on the provided stratigraphic detail. Relative to a profile defined at the 10 cm resolution of density and temperature measurements, the error introduced by simplification to a single layer of average properties increases approximately linearly with snow mass. If this brightness temperature error is converted into SWE using a traditional retrieval method then it is equivalent to ±13 mm SWE (7% of total) at a depth of 100 cm. This error is reduced to ±5.6 mm SWE (3 % of total) for a two-layer model.