Optimal discrimination and classification of THz spectra in the wavelet domain

In rapid scan Fourier transform spectrometry, we show that the noise in the wavelet coefficients resulting from the filter bank decomposition of the complex insertion loss function is linearly related to the noise power in the sample interferogram by a noise amplification factor. By maximizing an objective function composed of the power of the wavelet coefficients divided by the noise amplification factor, optimal feature extraction in the wavelet domain is performed. The performance of a classifier based on the output of a filter bank is shown to be considerably better than that of an Euclidean distance classifier in the original spectral domain. An optimization procedure results in a further improvement of the wavelet classifier. The procedure is suitable for enhancing the contrast or classifying spectra acquired by either continuous wave or THz transient spectrometers as well as for increasing the dynamic range of THz imaging systems. (C) 2003 Optical Society of America.

On improvement of classification accuracy for stochastic discrimination

Stochastic discrimination (SD) depends on a discriminant function for classification. In this paper, an improved SD is introduced to reduce the error rate of the standard SD in the context of a two-class classification problem. The learning procedure of the improved SD consists of two stages. Initially a standard SD, but with shorter learning period is carried out to identify an important space where all the misclassified samples are located. Then the standard SD is modified by 1) restricting sampling in the important space, and 2) introducing a new discriminant function for samples in the important space. It is shown by mathematical derivation that the new discriminant function has the same mean, but with a smaller variance than that of the standard SD for samples in the important space. It is also analyzed that the smaller the variance of the discriminant function, the lower the error rate of the classifier. Consequently, the proposed improved SD improves standard SD by its capability of achieving higher classification accuracy. Illustrative examples are provided to demonstrate the effectiveness of the proposed improved SD.