Information processing: US Patent 4,409,617

An information processor for rendering input data compatible with standard video recording and/or display equipment, comprizing means for digitizing the input data over periods which are synchronous with the fields of a standard video signal, a store adapted to store the digitized data and release stored digitized data in correspondence wiht the line scan of a standard video monitor, the store having two halves which correspond to the interlaced fields of a standard video signal and being so arranged that one half is filed while the other is emptied, and means for converting the released stored digitized data into video luminance signals. The input signals may be in digital or analogue form. A second stage which reconstitutes the recorded data is also described.

A narrow band pulsed eddy current instrument for materials testing

The principles of operation of an experimental prototype instrument known as J-SCAN are described along with the derivation of formulae for the rapid calculation of normalized impedances; the structure of the instrument; relevant probe design parameters; digital quantization errors; and approaches for the optimization of single frequency operation. An eddy current probe is used As the inductance element of a passive tuned-circuit which is repeatedly excited with short impulses. Each impulse excites an oscillation which is subject to decay dependent upon the values of the tuned-circuit components: resistance, inductance and capacitance. Changing conditions under the probe that affect the resistance and inductance of this circuit will thus be detected through changes in the transient response. These changes in transient response, oscillation frequency and rate of decay, are digitized, and then normalized values for probe resistance and inductance changes are calculated immediately in a micro processor. This approach coupled with a minimum analogue processing and maximum of digital processing has advantages compared with the conventional approaches to eddy current instruments. In particular there are: the absence of an out of balance condition and the flexibility and stability of digital data processing.

Review of theoretical models of electromagnetic NDT and their applications

There is an increasing interest in modelling electromagnetic methods of NDT - particularly eddy currents. A collaboration within the International Institute of Welding led to a survey intended to explain to non mathematicians the present scope of modelling. The present review commences with this survey and then points out some of the developments and some of the outstanding problems in transferring modelling into industry.

The modelling of electrical current NDT methods and its application to weld testing

Discussion of the numerical modeling of NDT methods based on the potential drop and the disruption of power lines to describe the nature, importance and application of modeling. La 1ère partie est consacrée aux applications aux contrôles par courants de Foucault. The first part is devoted to applications for inspection by eddy currents.

The modelling of electrical current NDT methods and its application to weld testing

Control by voltage drop DC. Contrôle par chute de potentiel de courant alternatif. Control by voltage drop AC.

Current deflection at cracks: some insights from modelling

Eddy current testing by current deflection detects surface cracks and geometric features by sensing the re-routing of currents. Currents are diverted by cracks in two ways: down the walls, and along their length at the surface. Current deflection utilises the latter currents, detecting them via their tangential magnetic field. Results from 3-D finite element computer modelling, which show the two forms of deflection, are presented. Further results indicate that the current deflection technique is suitable for the detection of surface cracks in smooth materials with varying material properties.

Application of personal computers to eddy current inspections

This presentation describes a system for measuring claddings as an example of the many possible advantages to be obtained by applying a personal computer to eddy current testing. A theoretical model and a learning algorithm are integrated into an instrument. They are supported in the PC, and serve to simplify and enhance multiparameter testing. The PC gives additional assistance by simplifying set-up procedures and data logging etc.

Eddy current testing program with scanning probe head having parallel and normal sensing coils

An eddy current testing system consists of a multi-sensor probe, computer and a special expansion card and software for data collection and analysis. The probe incorporates an excitation coil, and sensor coils; at least one sensor coil is a lateral current-normal coil and at least one is a current perturbation coil.

A lightweight technique for assessing risks in requirements analysis

A simple and practical technique for assessing the risks, that is, the potential for error, and consequent loss, in software system development, acquired during a requirements engineering phase is described. The technique uses a goal-based requirements analysis as a framework to identify and rate a set of key issues in order to arrive at estimates of the feasibility and adequacy of the requirements. The technique is illustrated and how it has been applied to a real systems development project is shown. How problems in this project could have been identified earlier is shown, thereby avoiding costly additional work and unhappy users.

Goal sketching and the business case

This paper describes how the business case can be characterized and used to quickly make an initial and structurally complete goal-responsibility model. This eases the problem of bringing disciplined support to key decision makers in a development project in such a way that it can be instantiated quickly and thereafter support all key decision gateways. This process also greatly improves the understanding shared by the key decision makers and helps to identify and manage load-bearing assumptions.

Long-term perspective of agile methods

Even if we have recognized many short-term benefits of agile methods, we still know very little about their long-term effects. In this panel, we discuss the long-term perspective of the agile methods. The panelists are either industrial or academic representatives. They will discuss problems and benefits related to the long-term lifecycle system management in agile projects. Ideally, the panel’s outcome will provide ideas for future research.