Hydrogeological, Geophysical And Geochemical Studies In Parts Of Coastal And Midland Areas, Central Kerala - A Gis Approach

The present study deals with the different hydrogeological characteristics of the coastal region of central Kerala and a comparative analysis with corresponding hard rock terrain. The coastal regions lie in areas where the aquifer systems discharge groundwater ultimately into the sea. Groundwater development in such regions will require a precise understanding of the complex mechanism of the saline and fresh water relationship, so that the withdrawals are so regulated as to avoid situations leading to upcoming of the saline groundwater bodies as also to prevent migration of sea water ingress further inland. Coastal tracts of Kerala are formed by several drainage systems. Thick pile of semi-consolidated and consolidated sediments from Tertiary to Recent age underlies it. These sediments comprise phreatic and confined aquifer systems. The corresponding hard rock terrain is encountered with laterites and underlined by the Precambrian metamorphic rocks. Supply of water from hard rock terrain is rather limited. This may be due to the small pore size, low degree of interconnectivity and low extent of weathering of the country rocks. The groundwater storage is mostly controlled by the thickness and hydrological properties of the weathered zone and the aquifer geometry. The over exploitation of groundwater, beyond the ‘safe yield’ limit, cause undesirable effects like continuous reduction in groundwater levels, reduction in river flows, reduction in wetland surface, degradation of groundwater quality and many other environmental problems like drought, famine etc.

Optical absorption studies in ion implanted and amorphous semiconductors - Investigations in some tetrahedrally co-ordinated and chalcogenide materials

The thesis provides an overall review and introduction to amorphous semiconductors, followed by a brief discussion on the important structural models proposed for chalcogenide glasses and their electrical, optional and thermal properties. It also gives a brief description of the Physics of thin films, ion implantation and Photothermal Deflection Spectroscopy. A brief description of the experimental setup of a photothermal deflection spectrometer and the details of the preparation and optical characterization of the thin film samples. It deals with the employment of the subgap optional absorption measurement by PDS to characterize the defects, amorphization and annealing behavior in silicon implanted with B+ ions and the profiles of ion range and vacancy distribution obtained by the TRIM simulation. It reports the results of all absorption measurements by PDS in nitrogen implanted thin film samples of Ge-Se and As-Se systems