Three Wavelength Optical Probe for Surface Roughness Measurements of Paper Samples

In the present diploma work optical inspection methods were used to investigate surface roughness of paper samples. A special measurement setup, which includes three laser light sources of three different wavelengths, photodetector and goniometer, was used to measure the reflected laser light properties. The intensity of the light reflected in specular direction was measured versus the laser incidence angle for reference metal sample. The value of roughness was estimated and compared to initially known value of metal sample roughness. Thus, the measurement equipment and method were validated. Then the reflected intensity was measured versus reflection angle at constant incidence angle for the same metal sample and paper samples under investigation. The final values of the surface roughness were obtained from the analysis of the reflected intensity dependence. The results are in good correlation with other research groups.

Meriteollisuuden talouden ja suhdanteiden kehitys 2006–2020 – FIMECC Probe -hankkeen toimialakatsaus 2012

Tämä Fimecc Innovations & Network -ohjelman PROBE-tutkimushankkeessa tehty raportti sisältää vuosittaisen katsauksen suomalaisten meriteollisuusyritysten taloudelliseen tilaan, markkinoiden kehitykseen sekä suhdanneodotuksiin. Talouden osalta raportti sisältää meriteollisuuden kokonaisvolyymin kehityksen arvioinnin, kasvun ja kannattavuuden seurannan toimijaryhmätasolla 2006–2011 sekä ennakkotietoja vuoden 2012 taloudellisesta kehityksestä (vuoden 2012 viralliset tilinpäätöstiedot ovat kattavasti saatavilla vasta loppuvuonna 2013). Talousosiossa on samalla pyritty arvioimaan yritysten aikaisempina vuosina tekemiä suhdanneodotuksia toteutuneeseen taloudelliseen tilanteeseen. Markkinasegmenttien tilannetta raportissa tarkastellaan kahden markkinan osalta: risteily- sekä ro-ro ja ro-pax -markkinoilla. Raportin kolmas osa tarkastelee yritysten suhdannenäkymiä vuodelle 2013 perustuen syksyn 2012 tilanteeseen. Osa sisältää myös erityisteeman Suomen koko meriteollisuuden kehityskuvasta vuodelle 2020, jossa yritykset arvioivat mm. alan tulevaisuuden vetureita, uhkia ja mahdollisuuksia sekä tarvittavia toimenpiteitä alan menestymiseksi tulevaisuudessa.

Kelvin Probe Force Microscopy (KPFM) characterization of lanthanum lutetium oxide high-k dielectric thin films

Lanthanum lutetium oxide (LaLuO3) thin films were investigated considering their perspective application for industrial microelectronics. Scanning probe microscopy (SPM) techniques permitted to visualize the surface topography and study the electric properties. This work compared both the material properties (charge behavior for samples of 6 nm and 25 nm width) and the applied SPM modes. Particularly, Kelvin probe force microscopy (KPFM) was applied to characterize local potential difference with high lateral resolution. Measurements showed the difference in morphology, chargeability and charge dissipation time for both samples. The polarity effect was detected for this material for the first time. Lateral spreading of the charged spots indicate the diffusive mechanism to be predominant in charge dissipation. This allowed to estimate the diffusion coefficient and mobility. Using simple electrostatic model it was found that charge is partly leaking into the interface oxide layer.

Peak Force Kelvin Probe Force Microscopy Investigation of ZrO2 Nanocomposites for Hygroelectricity Power Element

ZrO2 nanocomposites were investigated considering their perspective application in hygroelectric power elements. Scanning probe microscopy (SPM) techniques allowed to visualize the surface topography and electrical properties. In this work was compared spacial charge behaviour of sample in humid and dry air conditions. Also different SPM modes were compared. Kelvin probe force microscopy (KPFM) was applied to characterize the spacial charge distribution on surface of the sample. Measurements showed, that trapped charge is not dissipated and can be manipulated with low voltages. Humidity influence on the electric potential of the sample was shown.