Multiplicity of limit cycles and analytic m-solutions for planar differential systems

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Non-hyperbolic boundary equilibrium bifurcations in planar Filippov systems: a case study approach

Boundary equilibrium bifurcations in piecewise smooth discontinuous systems are characterized by the collision of an equilibrium point with the discontinuity surface. Generically, these bifurcations are of codimension one, but there are scenarios where the phenomenon can be of higher codimension. Here, the possible collision of a non-hyperbolic equilibrium with the boundary in a two-parameter framework and the nonlinear phenomena associated with such collision are considered. By dealing with planar discontinuous (Filippov) systems, some of such phenomena are pointed out through specific representative cases. A methodology for obtaining the corresponding bi-parametric bifurcation sets is developed.

A survey on the inverse integrating factor

The relation between limit cycles of planar differential systems and the inverse integrating factor was first shown in an article of Giacomini, Llibre and Viano appeared in 1996. From that moment on, many research articles are devoted to the study of the properties of the inverse integrating factor and its relationwith limit cycles and their bifurcations. This paper is a summary of all the results about this topic. We include a list of references together with the corresponding related results aiming at being as much exhaustive as possible. The paper is, nonetheless, self-contained in such a way that all the main results on the inverse integrating factor are stated and a complete overview of the subject is given. Each section contains a different issue to which the inverse integrating factor plays a role: the integrability problem, relation with Lie symmetries, the center problem, vanishing set of an inverse integrating factor, bifurcation of limit cycles from either a period annulus or from a monodromic ω-limit set and some generalizations.

Fine speckle contrast in InGaAs/InP systems: Influence of layer thickness, missmatch, and growing temperature

This work is focused on the study of the fine speckle contrast present in planar view observations of matched and mismatched InGaAs layers grown by molecular beam epitaxy on InP substrates. Our results provide experimental evidence of the evolution of this fine structure with the mismatch, layer thickness, and growth temperature. The correlation of the influence of all these parameters on the appearance of the contrast modulation points to the development of the fine structure during the growth. Moreover, as growth proceeds, this structure shows a dynamic behavior which depends on the intrinsic layer substrate stress.