El Memorial de Barcelona a Archer Milton Huntington, el fundador de la Hispanic Society of America, y a su esposa, la escultora, Anna Hyatt Huntington.

Barcelona en 1954 se anticipo a todos los homenajes, dedicando a Archer Milton Huntington (New York, 1870- Bathel, Connecticut, 1955) un monumento en reconocimiento a su excepcional figura como coleccionista e hispanófilo y también a su esposa, Anna Vaughn Hyatt Huntington (Cambridge, 1876 - California, 1973), excelente escultora que generosamente secundo los propósitos filo hispanos de su consorte. De esta manera Barcelona quería dejar constancia de su devoción y tributo a este reconocido coleccionista y filántropo americano que ayudo a vencer el llamado "Paradigma Prescott", historiador que había defendido las tesis sobre la leyenda negra española. A la vez que se reconocía que Archer M. Huntington ocupaba un lugar preeminente en la línea del hispanismo americano conjuntamente con los nombres de George Ticknor (1791 -1871), Washington Irving (1783-1859) y Henry Longfellow (1807-1882).

The Monument Erected in Barcelona in 1954 in Honor of Archer Milton Huntington, the Founder of The Hispanic Society of America, and His Wife, Anna Hyatt Huntington, the Eminent Sculptress.

It was in 1954 that Barcelona became the first city to pay tribute to Archer Milton Huntington (New York, 1870 - Bathel, Connecticut, 1955), by erecting a monument to the memory of this outstanding collector and Hispanist, and to hiswife, Anna Vaughn Hyatt Huntington (Cambridge, 1876 - California, 1973). An excellent sculptor, Anna Hyatt Huntington was also unstinting in her support of her husband¿s Hispanic interest. The monument was Barcelona's way of recognizing and paying tribute to this greatly respected American collector and philanthropist. Huntington played a major role in refuting "Prescott's Paradigm", named after the historian whose work on Spain did much to further the Black Legend.3 Moreover, Huntington occupied an important place in American Hispanic Studies, along with such other outstanding names as George Ticknor (Boston, 1791 - 1871), Washington Irving (New York, 1783 - 1859) and Henry Longfellow (1807 - 1882).

Film-free laser forward printing of transparent and weakly absorbing liquids

A laser-based technique for printing transparent and weakly absorbing liquids is developed. Its principle of operation relies in the tight focusing of short laser pulses inside the liquid and close to its free surface, in such a way that the laser radiation is absorbed in a tiny volume around the beam waist, with practically no absorption in any other location along the beam path. If the absorbed energy overcomes the optical breakdown threshold, a cavitation bubble is generated, and its expansion results in the propulsion of a small fraction of liquid which can be collected on a substrate, leading to the printing of a microdroplet for each laser pulse. The technique does not require the preparation of the liquid in thin film form, and its forward mode of operation imposes no restriction concerning the optical properties of the substrate. These characteristics make it well suited for printing a wide variety of materials of interest in diverse applications. We demonstrate that the film-free laser forward printing technique is capable of printing microdroplets with good resolution, reproducibility and control, and analyze the influence of the main process parameter, laser pulse energy. The mechanisms of liquid printing are also investigated: time-resolved imaging provides a clear picture of the dynamics of liquid transfer which allows understanding the main features observed in the printed droplets.

Optical correlation by use of partial phase-only modulation with VGA liquid-crystal displays

The development of liquid-crystal panels for use in commercial equipment has been aimed at improving the pixel resolution and the display efficiency. These improvements have led to a reduction in the thickness of such devices, among other outcomes, that involves a loss in phase modulation. We propose a modification of the classical phase-only filter to permit displays in VGA liquid-crystal panels with a constant amplitude modulation and less than a 2¿(PI) phase modulation. The method was tested experimentally in an optical setup.

Effects of thresholding level variation in fringe binarization of multiobject joint transform correlation

It is possible to improve the fringe binarization method of joint transform correlation by choosing a suitable threshold level.

Diffraction theory of Fresnel lenses encoded in low-resolution devices

A mathematical model that describes the behavior of low-resolution Fresnel lenses encoded in any low-resolution device (e.g., a spatial light modulator) is developed. The effects of low-resolution codification, such the appearance of new secondary lenses, are studied for a general case. General expressions for the phase of these lenses are developed, showing that each lens behaves as if it were encoded through all pixels of the low-resolution device. Simple expressions for the light distribution in the focal plane and its dependence on the encoded focal length are developed and commented on in detail. For a given codification device an optimum focal length is found for best lens performance. An optimization method for codification of a single lens with a short focal length is proposed.

Diffraction theory of optimized low-resolution Fresnel encoded lenses

A mathematical model describing the behavior of low-resolution Fresnel encoded lenses (LRFEL's) encoded in any low-resolution device (e.g., a spatial light modulator) has recently been developed. From this model, an LRFEL with a short focal length was optimized by our imposing the maximum intensity of light onto the optical axis. With this model, analytical expressions for the light-amplitude distribution, the diffraction efficiency, and the frequency response of the optimized LRFEL's are derived.

Application of fuzzy-rule-based postprocessing to correlation methods in pattern recognition

One of the most important problems in optical pattern recognition by correlation is the appearance of sidelobes in the correlation plane, which causes false alarms. We present a method that eliminate sidelobes of up to a given height if certain conditions are satisfied. The method can be applied to any generalized synthetic discriminant function filter and is capable of rejecting lateral peaks that are even higher than the central correlation. Satisfactory results were obtained in both computer simulations and optical implementation.

Computation of arbitrarily constrained synthetic discriminant functions

An algorithm for computing correlation filters based on synthetic discriminant functions that can be displayed on current spatial light modulators is presented. The procedure is nondivergent, computationally feasible, and capable of producing multiple solutions, thus overcoming some of the pitfalls of previous methods.

Numerical algorithm for spectroscopic ellipsometry of thick transparent films

We present a numerical method for spectroscopic ellipsometry of thick transparent films. When an analytical expression for the dispersion of the refractive index (which contains several unknown coefficients) is assumed, the procedure is based on fitting the coefficients at a fixed thickness. Then the thickness is varied within a range (according to its approximate value). The final result given by our method is as follows: The sample thickness is considered to be the one that gives the best fitting. The refractive index is defined by the coefficients obtained for this thickness.

Correlation postprocessing-based method for the detection of de focused images

We present a method to detect patterns in defocused scenes by means of a joint transform correlator. We describe analytically the correlation plane, and we also introduce an original procedure to recognize the target by postprocessing the correlation plane. The performance of the methodology when the defocused images are corrupted by additive noise is also considered.

Roughness and light scattering of ion-beam-sputtered fluoride coatings for 193 nm

Scattering characteristics of multilayer fluoride coatings for 193 nm deposited by ion beam sputtering and the related interfacial roughnesses are investigated. Quarter- and half-wave stacks of MgF2 and LaF3 with increasing thickness are deposited onto CaF2 and fused silica and are systematically characterized. Roughness measurements carried out by atomic force microscopy reveal the evolution of the power spectral densities of the interfaces with coating thickness. Backward-scattering measurements are presented, and the results are compared with theoretical predictions that use different models for the statistical correlation of interfacial roughnesses.

Procedure to characterize microroughness of optical thin films: application to ion-beam-sputtered vacuum-ultraviolet coatings

A method for characterizing the microroughness of samples in optical coating technology is developed. Measurements over different spatial-frequency ranges are composed into a single power spectral density (PSD) covering a large bandwidth. This is followed by the extraction of characteristic parameters through fitting of the PSD to a suitable combination of theoretical models. The method allows us to combine microroughness measurements performed with different techniques, and the fitting procedure can be adapted to any behavior of a combined PSD. The method has been applied to a set of ion-beam-sputtered fluoride vacuum-UV coatings with increasing number of alternative low- and high-index layers. Conclusions about roughness development and microstructural growth are drawn.

Surface characterization techniques for determining the root-mean-square roughness and power spectral densities of optical components

Surface topography and light scattering were measured on 15 samples ranging from those having smooth surfaces to others with ground surfaces. The measurement techniques included an atomic force microscope, mechanical and optical profilers, confocal laser scanning microscope, angle-resolved scattering, and total scattering. The samples included polished and ground fused silica, silicon carbide, sapphire, electroplated gold, and diamond-turned brass. The measurement instruments and techniques had different surface spatial wavelength band limits, so the measured roughnesses were not directly comparable. Two-dimensional power spectral density (PSD) functions were calculated from the digitized measurement data, and we obtained rms roughnesses by integrating areas under the PSD curves between fixed upper and lower band limits. In this way, roughnesses measured with different instruments and techniques could be directly compared. Although smaller differences between measurement techniques remained in the calculated roughnesses, these could be explained mostly by surface topographical features such as isolated particles that affected the instruments in different ways.