54 resultados para Raman amplifiers
Resumo:
InAlAs/InGaAs/InP based high electron mobility transistor devices have been structurally and electrically characterized, using transmission electron microscopy and Raman spectroscopy and measuring Hall mobilities. The InGaAs lattice matched channels, with an In molar fraction of 53%, grown at temperatures lower than 530¿°C exhibit alloy decomposition driving an anisotropic InGaAs surface roughness oriented along [1math0]. Conversely, lattice mismatched channels with an In molar fraction of 75% do not present this lateral decomposition but a strain induced roughness, with higher strength as the channel growth temperature increases beyond 490¿°C. In both cases the presence of the roughness implies low and anisotropic Hall mobilities of the two dimensional electron gas.
Resumo:
Nanocrystalline silicon layers have been obtained by thermal annealing of films sputtered in various hydrogen partial pressures. The as-deposited and crystallized films were investigated by infrared, Raman, x-ray diffraction, electron microscopy, and optical absorption techniques. The obtained data show evidence of a close correlation between the microstructure and properties of the processed material, and the hydrogen content in the as-grown deposit. The minimum stress deduced from Raman was found to correspond to the widest band gap and to a maximum hydrogen content in the basic unannealed sample. Such a structure relaxation seems to originate from the so-called "chemical annealing" thought to be due to Si-H2 species, as identified by infrared spectroscopy. The variation of the band gap has been interpreted in terms of the changes in the band tails associated with the disorder which would be induced by stress. Finally, the layers originally deposited with the highest hydrogen pressure show a lowest stress-which does not correlate with the hydrogen content and the optical band gap¿and some texturing. These features are likely related to the presence in these layers of a significant crystalline fraction already before annealing.
Resumo:
We study the influence of Nb doping on the TiO2 anatase-to-rutile phase transition, using combined transmission electron microscopy, Raman spectroscopy, x-ray diffraction and selected area electron diffraction analysis. This approach enabled anatase-to-rutile phase transition hindering to be clearly observed for low Nb-doped TiO2 samples. Moreover, there was clear grain growth inhibition in the samples containing Nb. The use of high resolution transmission electron microscopy with our samples provides an innovative perspective compared with previous research on this issue. Our analysis shows that niobium is segregated from the anatase structure before and during the phase transformation, leading to the formation of NbO nanoclusters on the surface of the TiO2 rutile nanoparticles.
Resumo:
We have employed time-dependent local-spin density-functional theory to analyze the multipole spin and charge density excitations in GaAs-AlxGa1-xAs quantum dots. The on-plane transferred momentum degree of freedom has been taken into account, and the wave-vector dependence of the excitations is discussed. In agreement with previous experiments, we have found that the energies of these modes do not depend on the transferred wave vector, although their intensities do. Comparison with a recent resonant Raman scattering experiment [C. Schüller et al., Phys. Rev. Lett. 80, 2673 (1998)] is made. This allows us to identify the angular momentum of several of the observed modes as well as to reproduce their energies
Resumo:
In this paper we present new results on doped μc-Si:H thin films deposited by hot-wire chemical vapour deposition (HWCVD) in the very low temperature range (125-275°C). The doped layers were obtained by the addition of diborane or phosphine in the gas phase during deposition. The incorporation of boron and phosphorus in the films and their influence on the crystalline fraction are studied by secondary ion mass spectrometry and Raman spectroscopy, respectively. Good electrical transport properties were obtained in this deposition regime, with best dark conductivities of 2.6 and 9.8 S cm -1 for the p- and n-doped films, respectively. The effect of the hydrogen dilution and the layer thickness on the electrical properties are also studied. Some technological conclusions referred to cross contamination could be deduced from the nominally undoped samples obtained in the same chamber after p- and n-type heavily doped layers.
Resumo:
Calcium phosphate coatings, obtained at different deposition rates by pulsed laser deposition with a Nd:YAG laser beam of 355-nm wavelength, were studied. The deposition rate was changed from 0.043 to 1.16 /shot by modification of only the ablated area, maintaining the local fluence constant to perform the ablation process in similar local conditions. Characterization of the coatings was performed by scanning electron microscopy, x-ray diffractometry, and infrared, micro-Raman, and x-ray photoelectron spectroscopy. The coatings showed a compact surface morphology formed by glassy gains with some droplets on them. Only hydroxyapatite (HA) and alpha-tricalcium phosphate (alpha-TCP) peaks were found in the x-ray diffractograms. The relative content of alpha TCP diminished with decreasing deposition rates, and only HA peaks were found for the lowest rate. The origin of alpha TCP is discussed.
Resumo:
Thin films of nanostructured silicon (ns-Si:H) were deposited by plasma-enhanced chemical vapor deposition in the presence of silicon nanoparticles at 100 C substrate temperature using silane and hydrogen gas mixture under continuous wave (cw) plasma conditions. The nanostructure of the films has been demonstrated by diverse ways: transmission electron microscopy, Raman spectroscopy and x-ray diffraction, which have shown the presence of ordered silicon clusters (1!=2 nm) embedded in an amorphous silicon matrix. Due to the presence of these ordered domains, the films crystallize faster than standard hydrogenated amorphous silicon samples, as evidenced by electrical measurements during the thermal annealing.
Resumo:
We report on the magneto-optical measurements of an epitaxial SrRuO3 film grown on SrTiO3 (0 0 1), which previously was determined to be single domain orientated by x-ray diffraction and Raman spectroscopy techniques. Our experiments reveal a large Kerr rotation, which reaches a maximum value of about 0.5° at low temperature. By measuring magnetic hysteresis loops at different temperatures, we determined the temperature dependence of the Kerr rotation in the polar configuration. Values of the anisotropic magnetoresistance ~ 20% have been measured. These values are remarkably higher than those of other metallic oxides such as manganites. This striking difference can be attributed to the strong spin-orbit interaction of the Ru 4d ion in the SrRuO3 compound.
Resumo:
Highly transparent and stoichiometric boron nitride (BN) films were deposited on both electrodes (anode and cathode) of a radio-frequency parallel-plate plasma reactor by the glow discharge decomposition of two gas mixtures: B2H6-H2-NH3 and B2H6-N2. The chemical, optical, and structural properties of the films, as well as their stability under long exposition to humid atmosphere, were analyzed by x-ray photoelectron, infrared, and Raman spectroscopies; scanning and transmission electron microscopies; and optical transmittance spectrophotometry. It was found that the BN films grown on the anode using the B2H6-H2-NH3 mixture were smooth, dense, adhered well to substrates, and had a textured hexagonal structure with the basal planes perpendicular to the film surface. These films were chemically stable to moisture, even after an exposition period of two years. In contrast, the films grown on the anode from the B2H6-N2 mixture showed tensile stress failure and were very unstable in the presence of moisture. However, the films grown on the cathode from B2H6-H2-NH3 gases suffered from compressive stress failure on exposure to air; whereas with B2H6-N2 gases, adherent and stable cathodic BN films were obtained with the same crystallographic texture as anodic films prepared from the B2H6-H2-NH3 mixture. These results are discussed in terms of the origin of film stress, the effects of ion bombardment on the growing films, and the surface chemical effects of hydrogen atoms present in the gas discharge.
Resumo:
We investigated the influence of a hydrogenated disordered carbon (a-C:H) layer on the nucleation of diamond. Substrates c-Si<100>, SiAlON, and highly oriented pyrolytic graphite {0001} were used in this study. The substrate surfaces were characterized with Auger electron spectroscopy (AES) while diamond growth was followed with Raman spectroscopy and scanning electron microscopy (SEM). It was found that on silicon and SiAlON substrates the presence of the a-C:H layer enabled diamond to grow readily without any polishing treatment. Moreover, more continuous diamond films could be grown when the substrate was polished with diamond powder prior to the deposition of the a-C:H layer. This important result suggests that the nucleation of diamond occurs readily on disordered carbon surfaces, and that the formation of this type of layer is indeed one step in the diamond nucleation mechanism. Altogether, the data refute the argument that silicon defects play a direct role in the nucleation process. Auger spectra revealed that for short deposition times and untreated silicon surfaces, the deposited layer corresponds to an amorphous carbon layer. In these cases, the subsequent diamond nucleation was found to be limited. However, when the diamond nucleation density was found to be high; i.e., after lengthy deposits of a¿C:H or after diamond polishing, the Auger spectra suggested diamondlike carbon layers.
Resumo:
Esta contribución presenta el Proyecto de investigación que se está llevando a cabo en la Sección de Conservación¿Restauración de la Facultad de Bellas Artes de la Universidad de Barcelona desde el año 2006. El proyecto tiene por objetivo identificar los problemas que generan los tratamientos con PVAc, poliacetato de vinilo, en diversos bienes patrimoniales, así como el establecimiento de protocolos para la reversibilización del adhesivo. El trabajo se centra en los materiales de archivo, los materiales arqueológicos, la pinturasobre tela, sobre madera y la pintura mural por ser casos especialmente representativos de patrimonio en los que se ha utilizado este adhesivo y en los que se pueden detectar problemas derivados de su utilización. El estudio parte de la selección de obras originales procedentes de museos e instituciones colaboradoras que fueron tratadas con poliacetato de vinilo. De éstas obras se extrajeron muestras para caracterizar su composición y estado conservación. Una vez conocida la estructura de las obras se prepararon muestras probeta simulando las obras originales y se sometieron a un proceso de envejecimiento acelerado. A partir de estos simulacros se realizaron análisis para conocer los efectos derivados del uso del PVAc en tratamientos de conservación-restauración. Las técnicas de análisis empleadas fueron: medición de pH, espectroscopía de IR por transformada de Fourier (FTIR), análisis de pirolisis-cromatografía de gases / espectrometría de masas (Py-GC-MS), espectroscopia Raman por transformada de Fourier (FT-Raman), análisis de color, microscopía electrónica de barrido, espectroscopia de dispersión de rayos X (SEM-EDX) y microscopía óptica. Con la divulgación de los resultados acerca de la composición, pH, color, efectos del adhesivo sobre los soportes, propiedades mecánicas y reversibilización del adhesivo, obtenidos de las muestras probeta antes y después de la primera fase de envejecimiento acelerado, así como en unas muestras de adhesivos envejecidas de forma natural durante 10 años, se pretende fomentar la difusión y el intercambio de información entre los centros dedicados a la Conservación-Restauración del patrimonio.
Resumo:
Esta contribución presenta el Proyecto de investigación que se está llevando a cabo en la Sección de Conservación¿Restauración de la Facultad de Bellas Artes de la Universidad de Barcelona desde el año 2006. El proyecto tiene por objetivo identificar los problemas que generan los tratamientos con PVAc, poliacetato de vinilo, en diversos bienes patrimoniales, así como el establecimiento de protocolos para la reversibilización del adhesivo. El trabajo se centra en los materiales de archivo, los materiales arqueológicos, la pinturasobre tela, sobre madera y la pintura mural por ser casos especialmente representativos de patrimonio en los que se ha utilizado este adhesivo y en los que se pueden detectar problemas derivados de su utilización. El estudio parte de la selección de obras originales procedentes de museos e instituciones colaboradoras que fueron tratadas con poliacetato de vinilo. De éstas obras se extrajeron muestras para caracterizar su composición y estado conservación. Una vez conocida la estructura de las obras se prepararon muestras probeta simulando las obras originales y se sometieron a un proceso de envejecimiento acelerado. A partir de estos simulacros se realizaron análisis para conocer los efectos derivados del uso del PVAc en tratamientos de conservación-restauración. Las técnicas de análisis empleadas fueron: medición de pH, espectroscopía de IR por transformada de Fourier (FTIR), análisis de pirolisis-cromatografía de gases / espectrometría de masas (Py-GC-MS), espectroscopia Raman por transformada de Fourier (FT-Raman), análisis de color, microscopía electrónica de barrido, espectroscopia de dispersión de rayos X (SEM-EDX) y microscopía óptica. Con la divulgación de los resultados acerca de la composición, pH, color, efectos del adhesivo sobre los soportes, propiedades mecánicas y reversibilización del adhesivo, obtenidos de las muestras probeta antes y después de la primera fase de envejecimiento acelerado, así como en unas muestras de adhesivos envejecidas de forma natural durante 10 años, se pretende fomentar la difusión y el intercambio de información entre los centros dedicados a la Conservación-Restauración del patrimonio.
Resumo:
The structural relaxation of pure amorphous silicon a-Si and hydrogenated amorphous silicon a-Si:H materials, that occurs during thermal annealing experiments, has been analyzed by Raman spectroscopy and differential scanning calorimetry. Unlike a-Si, the heat evolved from a-Si:H cannot be explained by relaxation of the Si-Si network strain but it reveals a derelaxation of the bond angle strain. Since the state of relaxation after annealing is very similar for pure and hydrogenated materials, our results give strong experimental support to the predicted configurational gap between a-Si and crystalline silicon.
Resumo:
In recent years, there has been an increased attention towards the composition of feeding fats. In the aftermath of the BSE crisis all animal by-products utilised in animal nutrition have been subjected to close scrutiny. Regulation requires that the material belongs to the category of animal by-products fit for human consumption. This implies the use of reliable techniques in order to insure the safety of products. The feasibility of using rapid and non-destructive methods, to control the composition of feedstuffs on animal fats has been studied. Fourier Transform Raman spectroscopy has been chosen for its advantage to give detailed structural information. Data were treated using chemometric methods as PCA and PLS-DA which have permitted to separate well the different classes of animal fats. The same methodology was applied on fats from various types of feedstock and production technology processes. PLS-DA model for the discrimination of animal fats from the other categories presents a sensitivity and a specificity of 0.958 and 0.914, respectively. These results encourage the use of FT-Raman spectroscopy to discriminate animal fats.