On the development of a test-bed application for the ART-WiSe architecture

The ART-WiSe (Architecture for Real-Time communications in Wireless Sensor Networks) framework aims at the design of new communication architectures and mechanisms for time-sensitive Wireless Sensor Networks (WSNs). We adopted a two-tiered architecture where an overlay Wireless Local Area Network (Tier 2) serves as a backbone for a WSN (Tier 1), relying on existing standard communication protocols and commercial-off-the-shell (COTS) technologies – IEEE 802.15.4/ZigBee for Tier 1 and IEEE 802.11 for Tier 2. In this line, a test-bed application is being developed for assessing, validating and demonstrating the ART-WiSe architecture. A pursuit-evasion application was chosen since it fulfils a number of requirements, namely it is feasible and appealing and imposes some stress to the architecture in terms of timeliness. To develop the testbed based on the previously referred technologies, an implementation of the IEEE 8021.5.4/ZigBee protocols is being carried out, since there is no open source available to the community. This paper highlights some relevant aspects of the ART-WiSe architecture, provides some intuition on the protocol stack implementation and presents a general view over the envisaged test-bed application.

From design-for-test to design-for-debug-and-test: analysis of requirements and limitations for 1149.1

The increasing complexity of VLSI circuits and the reduced accessibility of modern packaging and mounting technologies restrict the usefulness of conventional in-circuit debugging tools, such as in-circuit emulators for microprocessors and microcontrollers. However, this same trend enables the development of more complex products, which in turn require more powerful debugging tools. These conflicting demands could be met if the standard scan test infrastructures now common in most complex components were able to match the debugging requirements of design verification and prototype validation. This paper analyses the main debug requirements in the design of microprocessor-based applications and the feasibility of their implementation using the mandatory, optional and additional operating modes of the standard IEEE 1149.1 test infrastructure.

Tensile fracture characterization of adhesive joints by standard and optical techniques

The use of adhesive joints has increased in recent decades due to its competitive features compared with traditional methods. This work aims to estimate the tensile critical strain energy release rate (GIC) of adhesive joints by the Double-Cantilever Beam (DCB) test. The J-integral is used since it enables obtaining the tensile Cohesive Zone Model (CZM) law. An optical measuring method was developed for assessing the crack tip opening (δn) and adherends rotation (θo). The proposed CZM laws were best approximated by a triangular shape for the brittle adhesive and a trapezoidal shape for the two ductile adhesives.