Analysis of UV spectral bands using multidimensional scaling

This study describes the change of the ultraviolet spectral bands starting from 0.1 to 5.0 nm slit width in the spectral range of 200–400 nm. The analysis of the spectral bands is carried out by using the multidimensional scaling (MDS) approach to reach the latent spectral background. This approach indicates that 0.1 nm slit width gives higher-order noise together with better spectral details. Thus, 5.0 nm slit width possesses the higher peak amplitude and lower-order noise together with poor spectral details. In the above-mentioned conditions, the main problem is to find the relationship between the spectral band properties and the slit width. For this aim, the MDS tool is to used recognize the hidden information of the ultraviolet spectra of sildenafil citrate by using a ShimadzuUV–VIS 2550, which is in theworld the best double monochromator instrument. In this study, the proposed mathematical approach gives the rich findings for the efficient use of the spectrophotometer in the qualitative and quantitative studies.

A comparative analysis of fault injection methods via enhanced on-chip debug infrastructures

On-chip debug (OCD) features are frequently available in modern microprocessors. Their contribution to shorten the time-to-market justifies the industry investment in this area, where a number of competing or complementary proposals are available or under development, e.g. NEXUS, CJTAG, IJTAG. The controllability and observability features provided by OCD infrastructures provide a valuable toolbox that can be used well beyond the debugging arena, improving the return on investment rate by diluting its cost across a wider spectrum of application areas. This paper discusses the use of OCD features for validating fault tolerant architectures, and in particular the efficiency of various fault injection methods provided by enhanced OCD infrastructures. The reference data for our comparative study was captured on a workbench comprising the 32-bit Freescale MPC-565 microprocessor, an iSYSTEM IC3000 debugger (iTracePro version) and the Winidea 2005 debugging package. All enhanced OCD infrastructures were implemented in VHDL and the results were obtained by simulation within the same fault injection environment. The focus of this paper is on the comparative analysis of the experimental results obtained for various OCD configurations and debugging scenarios.

Analysis of UV spectral bands using multidimensional scaling

This study describes the change of the ultraviolet spectral bands starting from 0.1 to 5.0 nm slit width in the spectral range of 200–400 nm. The analysis of the spectral bands is carried out by using the multidimensional scaling (MDS) approach to reach the latent spectral background. This approach indicates that 0.1 nm slit width gives higher-order noise together with better spectral details. Thus, 5.0 nm slit width possesses the higher peak amplitude and lower-order noise together with poor spectral details. In the above-mentioned conditions, the main problem is to find the relationship between the spectral band properties and the slit width. For this aim, the MDS tool is to used recognize the hidden information of the ultraviolet spectra of sildenafil citrate by using a Shimadzu UV–VIS 2550, which is in the world the best double monochromator instrument. In this study, the proposed mathematical approach gives the rich findings for the efficient use of the spectrophotometer in the qualitative and quantitative studies.