2 resultados para multiple resistance

em CiencIPCA - Instituto Politécnico do Cávado e do Ave, Portugal


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Experimental scratch resistance testing provides two numbers: the penetration depth Rp and the healing depth Rh. In molecular dynamics computer simulations, we create a material consisting of N statistical chain segments by polymerization; a reinforcing phase can be included. Then we simulate the movement of an indenter and response of the segments during X time steps. Each segment at each time step has three Cartesian coordinates of position and three of momentum. We describe methods of visualization of results based on a record of 6NX coordinates. We obtain a continuous dependence on time t of positions of each of the segments on the path of the indenter. Scratch resistance at a given location can be connected to spatial structures of individual polymeric chains.

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The radial undistortion model proposed by Fitzgibbon and the radial fundamental matrix were early steps to extend classical epipolar geometry to distorted cameras. Later minimal solvers have been proposed to find relative pose and radial distortion, given point correspondences between images. However, a big drawback of all these approaches is that they require the distortion center to be exactly known. In this paper we show how the distortion center can be absorbed into a new radial fundamental matrix. This new formulation is much more practical in reality as it allows also digital zoom, cropped images and camera-lens systems where the distortion center does not exactly coincide with the image center. In particular we start from the setting where only one of the two images contains radial distortion, analyze the structure of the particular radial fundamental matrix and show that the technique also generalizes to other linear multi-view relationships like trifocal tensor and homography. For the new radial fundamental matrix we propose different estimation algorithms from 9,10 and 11 points. We show how to extract the epipoles and prove the practical applicability on several epipolar geometry image pairs with strong distortion that - to the best of our knowledge - no other existing algorithm can handle properly.