Effects of intensity and positional predictability of a visual stimulus on simple reaction time

The influence of visual stimuli intensity on manual reaction time (RT) was investigated under two different attentional settings: high (Experiment 1) and low (Experiment 2) stimulus location predictability. These two experiments were also run under both binocular and monocular viewing conditions. We observed that RT decreased as stimulus intensity increased. It also decreased as the viewing condition was changed from monocular to binocular as well as the location predictability shifted from low to high. A significant interaction was found between stimulus intensity and viewing condition, but no interaction was observed between neither of these factors and location predictability. These findings support the idea that the stimulus intensity effect arises from purely sensory, pre-attentive mechanisms rather than deriving from more efficient attentional capture. (C) 2010 Elsevier Ireland Ltd. All rights reserved.

Fault Coverage-Driven Incremental Test Generation

In this paper, we consider a classical problem of complete test generation for deterministic finite-state machines (FSMs) in a more general setting. The first generalization is that the number of states in implementation FSMs can even be smaller than that of the specification FSM. Previous work deals only with the case when the implementation FSMs are allowed to have the same number of states as the specification FSM. This generalization provides more options to the test designer: when traditional methods trigger a test explosion for large specification machines, tests with a lower, but yet guaranteed, fault coverage can still be generated. The second generalization is that tests can be generated starting with a user-defined test suite, by incrementally extending it until the desired fault coverage is achieved. Solving the generalized test derivation problem, we formulate sufficient conditions for test suite completeness weaker than the existing ones and use them to elaborate an algorithm that can be used both for extending user-defined test suites to achieve the desired fault coverage and for test generation. We present the experimental results that indicate that the proposed algorithm allows obtaining a trade-off between the length and fault coverage of test suites.