Selective SWIFT-R. A Flexible Software-Based Technique for Soft Error Mitigation in Low-Cost Embedded Systems

Commercial off-the-shelf microprocessors are the core of low-cost embedded systems due to their programmability and cost-effectiveness. Recent advances in electronic technologies have allowed remarkable improvements in their performance. However, they have also made microprocessors more susceptible to transient faults induced by radiation. These non-destructive events (soft errors), may cause a microprocessor to produce a wrong computation result or lose control of a system with catastrophic consequences. Therefore, soft error mitigation has become a compulsory requirement for an increasing number of applications, which operate from the space to the ground level. In this context, this paper uses the concept of selective hardening, which is aimed to design reduced-overhead and flexible mitigation techniques. Following this concept, a novel flexible version of the software-based fault recovery technique known as SWIFT-R is proposed. Our approach makes possible to select different registers subsets from the microprocessor register file to be protected on software. Thus, design space is enriched with a wide spectrum of new partially protected versions, which offer more flexibility to designers. This permits to find the best trade-offs between performance, code size, and fault coverage. Three case studies have been developed to show the applicability and flexibility of the proposal.

S-SETA: Selective Software-Only Error-Detection Technique Using Assertions

Software-based techniques offer several advantages to increase the reliability of processor-based systems at very low cost, but they cause performance degradation and an increase of the code size. To meet constraints in performance and memory, we propose SETA, a new control-flow software-only technique that uses assertions to detect errors affecting the program flow. SETA is an independent technique, but it was conceived to work together with previously proposed data-flow techniques that aim at reducing performance and memory overheads. Thus, SETA is combined with such data-flow techniques and submitted to a fault injection campaign. Simulation and neutron induced SEE tests show high fault coverage at performance and memory overheads inferior to the state-of-the-art.