Quantum-gate characterization in an extended Hilbert space

We describe an approach for characterizing the process performed by a quantum gate using quantum process tomography, by first modeling the gate in an extended Hilbert space, which includes nonqubit degrees of freedom. To prevent unphysical processes from being predicted, present quantum process tomography procedures incorporate mathematical constraints, which make no assumptions as to the actual physical nature of the system being described. By contrast, the procedure presented here assumes a particular class of physical processes, and enforces physicality by fitting the data to this model. This allows quantum process tomography to be performed using a smaller experimental data set, and produces parameters with a direct physical interpretation. The approach is demonstrated by example of mode matching in an all-optical controlled-NOT gate. The techniques described are general and could be applied to other optical circuits or quantum computing architectures.

Demonstration of a simple entangling optical gate and its use in bell-state analysis

We demonstrate a new architecture for an optical entangling gate that is significantly simpler than previous realizations, using partially polarizing beam splitters so that only a single optical mode-matching condition is required. We demonstrate operation of a controlled-z gate in both continuous-wave and pulsed regimes of operation, fully characterizing it in each case using quantum process tomography. We also demonstrate a fully resolving, nondeterministic optical Bell-state analyzer based on this controlled-z gate. This new architecture is ideally suited to guided optics implementations of optical gates.

Practical limitations in optical entanglement purification

Entanglement purification protocols play an important role in the distribution of entangled systems, which is necessary for various quantum information processing applications. We consider the effects of photodetector efficiency and bandwidth, channel loss and mode mismatch on the operation of an optical entanglement purification protocol. We derive necessary detector and mode-matching requirements to facilitate practical operation of such a scheme, without having to resort to destructive coincidence-type demonstrations.

Application of edge-to-edge matching model to understand the in-plane texture of TiSi2 (C49) thin films on (001)(Si) surface

The edge-to-edge matching model, which was originally developed for predicting crystallographic features in diffusional phase transformations in solids, has been used to understand the formation of in-plane textures in TiSi2 (C49) thin films on Si single crystal (001)si surface. The model predicts all the four previously reported orientation relationships between C49 and Si substrate based on the actual atom matching across the interface and the basic crystallographic data only. The model has strong potential to be used to develop new thin film materials. (c) 2006 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

Receiving mutual impedance between two normal-mode helical antennas (NMHAs)

A new mutual impedance - the receiving mutual impedance - between two normal-mode helical antennas is defined, measured, and theoretically calculated. The variations of the receiving mutual impedance with antenna separation, with frequency, and with excitation source direction are critically investigated. An application of the receiving mutual impedance in direction finding demonstrates its more accurate description of the mutual coupling effect than that using the conventional mutual impedance.