Determination of strontium segregation in modified hypoeutectic Al-Si alloy by micro X-ray fluorescence analysis

Analysis of intra- and inter-phase distribution of modifying elements in aluminium-silicon alloys is difficult due to the low concentrations used. This research utilises a mu-XRF (X-ray fluorescence) technique at the SPring-8 synchrotron radiation facility X-ray source and reveals that the modifying element strontium segregates exclusively to the eutectic silicon phase and the distribution of strontium within this phase is relatively homogeneous. This has important implications for the fundamental mechanisms of eutectic modification in hypoeutectic aluminium-silicon alloys. (c) 2006 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.