Measuring geometric phases of scattering states in nanoscale electronic devices

We show how a quantum property, a geometric phase, associated with scattering states can be exhibited in nanoscale electronic devices. We propose an experiment to use interference to directly measure the effect of this geometric phase. The setup involves a double-path interferometer, adapted from that used to measure the phase evolution of electrons as they traverse a quantum dot (QD). Gate voltages on the QD could be varied cyclically and adiabatically, in a manner similar to that used to observe quantum adiabatic charge pumping. The interference due to the geometric phase results in oscillations in the current collected in the drain when a small bias across the device is applied. We illustrate the effect with examples of geometric phases resulting from both Abelian and non-Abelian gauge potentials.

A new decoupling method for quadrature coils in magnetic resonance imaging

A powerful decoupling method is introduced to obtain decoupled signal voltages from quadrature coils in magnetic resonance imaging (MRI). The new method uses the knowledge of the position of the signal source in MRI, the active slice, to define a new mutual impedance which accurately quantifies the coupling voltages and enables them to be removed almost completely. Results show that by using the new decoupling method, the percentage errors in the decoupled voltages are of the order of 10(-7)% and isolations between two coils are more than 170 dB.