30 resultados para Edge detectors


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The edge-to-edge matching model, which was originally developed for predicting crystallographic features in diffusional phase transformations in solids, has been used to understand the formation of in-plane textures in TiSi2 (C49) thin films on Si single crystal (001)si surface. The model predicts all the four previously reported orientation relationships between C49 and Si substrate based on the actual atom matching across the interface and the basic crystallographic data only. The model has strong potential to be used to develop new thin film materials. (c) 2006 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

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Photo-detection plays a fundamental role in experimental quantum optics and is of particular importance in the emerging field of linear optics quantum computing. Present theoretical treatment of photo-detectors is highly idealized and fails to consider many important physical effects. We present a physically motivated model for photo-detectors which accommodates for the effects of finite resolution, bandwidth and efficiency, as well as dark counts and dead-time. We apply our model to two simple well-known applications, which illustrates the significance of these characteristics.

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The orientation relationship (OR) between the beta(Zn) phase and the alpha(Al) phase and the corresponding habit planes in a Zn-Al eutectoid alloy were accurately determined using convergent beam Kikuchi line diffraction patterns. In addition to the previously reported OR. [11 (2) over bar0](beta)parallel to[110](alpha), (0002)(beta)parallel to ((1) over bar 11)alpha, two new ORs were observed. They are: [11 (2) over bar0](beta)parallel to [110], ((1) over bar 101)(beta) 0.82 degrees from (002)(alpha) and [(1) over bar 100](beta)parallel to[112](alpha), (0002)(beta) 4.5 degrees from (111)(alpha). These ORs can be explained and understood using the recently developed edge-to-edge matching model. (c) 2006 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

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An edge-colored graph is a graph H together with a function f:E(H) → C where C is a set of colors. Given an edge-colored graph H, the graph induced by the edges of color c C is denoted by H(c). Let G, H, and J be graphs and let μ be a positive integer. A (J, H, G, μ) edge-colored graph decomposition is a set S = {H 1,H 2,...,H t} of edge-colored graphs with color set C = {c 1, c 2,..., c k} such that Hi ≅ H for 1 ≤ i ≤ t; Hi (cj) ≅ G for 1 ≤ i ≤ t and ≤ j ≤ k; and for j = 1, 2,..., k, each edge of J occurs in exactly μ of the graphs H 1(c j ), H 2(c j ),..., H t (c j ). Let Q 3 denote the 3-dimensional cube. In this paper, we find necessary and sufficient conditions on n, μ and G for the existence of a (K n ,Q 3,G, μ) edge-colored graph decomposition. © Birkhäuser Verlag, Basel 2007.

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The basis of the present authors' edge-to-edge matching model for understanding the crystallography of partially coherent precipitates is the minimization of the energy of the interface between the two phases. For relatively simple crystal structures, this energy minimization occurs when close-packed, or relatively close-packed, rows of atoms match across the interface. Hence, the fundamental principle behind edge-to-edge matching is that the directions in each phase that correspond to the edges of the planes that meet in the interface should be close-packed, or relatively close-packed, rows of atoms. A few of the recently reported examples of what is termed edge-to-edge matching appear to ignore this fundamental principle. By comparing theoretical predictions with available experimental data, this article will explore the validity of this critical atom-row coincidence condition, in situations where the two phases have simple crystal Structures and in those where the precipitate has a more complex structure.

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