Building Support Vector Machines in the Context of Regularised Least Squares

This paper formulates a linear kernel support vector machine (SVM) as a regularized least-squares (RLS) problem. By defining a set of indicator variables of the errors, the solution to the RLS problem is represented as an equation that relates the error vector to the indicator variables. Through partitioning the training set, the SVM weights and bias are expressed analytically using the support vectors. It is also shown how this approach naturally extends to Sums with nonlinear kernels whilst avoiding the need to make use of Lagrange multipliers and duality theory. A fast iterative solution algorithm based on Cholesky decomposition with permutation of the support vectors is suggested as a solution method. The properties of our SVM formulation are analyzed and compared with standard SVMs using a simple example that can be illustrated graphically. The correctness and behavior of our solution (merely derived in the primal context of RLS) is demonstrated using a set of public benchmarking problems for both linear and nonlinear SVMs.

Feature Selection for Anomaly Detection Using Optical Emission Spectroscopy

To maintain the pace of development set by Moore's law, production processes in semiconductor manufacturing are becoming more and more complex. The development of efficient and interpretable anomaly detection systems is fundamental to keeping production costs low. As the dimension of process monitoring data can become extremely high anomaly detection systems are impacted by the curse of dimensionality, hence dimensionality reduction plays an important role. Classical dimensionality reduction approaches, such as Principal Component Analysis, generally involve transformations that seek to maximize the explained variance. In datasets with several clusters of correlated variables the contributions of isolated variables to explained variance may be insignificant, with the result that they may not be included in the reduced data representation. It is then not possible to detect an anomaly if it is only reflected in such isolated variables. In this paper we present a new dimensionality reduction technique that takes account of such isolated variables and demonstrate how it can be used to build an interpretable and robust anomaly detection system for Optical Emission Spectroscopy data.