3 resultados para Agilent

em QUB Research Portal - Research Directory and Institutional Repository for Queen's University Belfast


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A power combining strategy for Class-E and inverse Class-E amplifiers operating at high frequencies such that they can operate into unbalanced loads is proposed. This power combining method is particularly important for the inverse Class-E amplifier configuration whose single-stage topology is naturally limited for small-to-medium power applications. Design examples for the power combining synthesis of classical Class-E and then inverse Class-E amplifiers with specification 3 V-1.5 W-2.5 GHz are given. For this specification, it is shown that a three-branch combiner has a natural 50 V output impedance. The resulting circuits are simulated within Agilent Advanced Design Systems environment with good agreement to theoretical prediction. Further the performance of the proposed circuits when operated in a Linear amplification using Nonlinear Components transmitter configuration whereby two-branch amplifiers are driven with constant amplitude conjugate input phase signals is investigated.

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The X-parameter based nonlinear modelling tools have been adopted as the foundation for the advanced methodology
of experimental characterisation and design of passive nonlinear devices. Based upon the formalism of the Xparameters,
it provides a unified framework for co-design of antenna beamforming networks, filters, phase shifters and
other passive and active devices of RF front-end, taking into account the effect of their nonlinearities. The equivalent
circuits of the canonical elements are readily incorporated in the models, thus enabling evaluation of PIM effect on the
performance of individual devices and their assemblies. An important advantage of the presented methodology is its
compatibility with the industry-standard established commercial RF circuit simulator Agilent ADS.
The major challenge in practical implementation of the proposed approach is concerned with experimental retrieval of the X-parameters for canonical passive circuit elements. To our best knowledge commercial PIM testers and practical laboratory test instruments are inherently narrowband and do not allow for simultaneous vector measurements at the PIM and harmonic frequencies. Alternatively, existing nonlinear vector analysers (NVNA) support X-parameter measurements in a broad frequency bands with a range of stimuli, but their dynamic range is insufficient for the PIM characterisation in practical circuits. Further opportunities for adaptation of the X-parameters methodology to the PIM
characterisation of passive devices using the existing test instruments are explored.