32 resultados para tansmission electron microscopy


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Freestanding BaTiO3 nanodots exhibit domain structures characterized by distinct quadrants of ferroelastic 90 domains in transmission electron microscopy (TEM) observations. These differ significantly from flux-closure domain patterns in the same systems imaged by piezoresponse force microscopy. Based upon a series of phase field simulations of BaTiO3 nanodots, we suggest that the TEM patterns result from a radial electric field arising from electron beam charging of the nanodot. For sufficiently large charging, this converts flux-closure domain patterns to quadrant patterns with radial net polarizations. Not only does this explain the puzzling patterns that have been observed in TEM studies of ferroelectric nanodots, but also suggests how to manipulate ferroelectric domain patterns via electron beams.

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The proliferation of mobile devices in society accessing data via the ‘cloud’ is imposing a dramatic increase in the amount of information to be stored on hard disk drives (HDD) used in servers. Forecasts are that areal densities will need to increase by as much as 35% compound per annum and by 2020 cloud storage capacity will be around 7 zettabytes corresponding to areal densities of 2 Tb/in2. This requires increased performance from the magnetic pole of the electromagnetic writer in the read/write head in the HDD. Current state-of-art writing is undertaken by morphologically complex magnetic pole of sub 100 nm dimensions, in an environment of engineered magnetic shields and it needs to deliver strong directional magnetic field to areas on the recording media around 50 nm x 13 nm. This points to the need for a method to perform direct quantitative measurements of the magnetic field generated by the write pole at the nanometer scale. Here we report on the complete in situ quantitative mapping of the magnetic field generated by a functioning write pole in operation using electron holography. Opportunistically, it points the way towards a new nanoscale magnetic field source to further develop in situ Transmission Electron Microscopy.