Material properties, geometry and their effect on the fatigue life of two flip-chip models

This paper describes how modeling technology has been used in providing fatigue life time data of two flip-chip models. Full-scale three-dimensional modeling of flip-chips under cyclic thermal loading has been combined with solder joint stand-off height prediction to analyze the stress and strain conditions in the two models. The Coffin-Manson empirical relationship is employed to predict the fatigue life times of the solder interconnects. In order to help designers in selecting the underfill material and the printed circuit board, the Young's modulus and the coefficient of thermal expansion of the underfill, as well as the thickness of the printed circuit boards are treated as variable parameters. Fatigue life times are therefore calculated over a range of these material and geometry parameters. In this paper we will also describe how the use of micro-via technology may affect fatigue life

A model to predict the life of pneumatic conveyor bends

A new approach to the prediction of bend lifetime in pneumatic conveyors, subject to erosive wear is described. Mathematical modelling is exploited. Commercial Computational Fluid Dynamics (CFD) software is used for the prediction of air flow and particle tracks, and custom code for the modelling of bend erosion and lifetime prediction. The custom code uses a toroidal geometry, and employs a range of empirical data rather than trying to fit classical erosion models to a particular circumstance. The data used was obtained relatively quickly and easily from a gas-blast erosion tester. A full-scale pneumatic conveying rig was used to validate a sample of the bend lifetime predictions, and the results suggest accuracy of within ±65%, using calibration methods. Finally, the work is distilled into user-friendly interactive software that will make erosion lifetime predictions for a wide range of bends under varying conveying conditions. This could be a valuable tool for the pneumatic conveyor design or maintenance engineer.

[Book review] Reviews. [1] Nicholas Crane, Mercator: The Man Who Mapped the Planet, London: Weidenfield and Nicolson, 2002. [2] Stephen Inwood: The Man Who Knew Too Much: The Strange and Inventive Life of Robert Hooke (1635-1703), London: Macmillan, 2002

Book reviews of: [1] Nicholas Crane, Mercator: The Man Who Mapped the Planet, London: Weidenfield and Nicolson, 2002, £20, ISBN: 0297646656. [2] Stephen Inwood: The Man Who Knew Too Much: The Strange and Inventive Life of Robert Hooke (1635-1703), London: Macmillan, 2002, £18.99, ISBN: 0333782860.

[Book review] Reviews. Peter Aughton, The Transit of Venus: The Brief, Brilliant Life of Jeremiah Horrocks, Father of British Astronomy, Orion, 2004

Book review of: Peter Aughton, The Transit of Venus: The Brief, Brilliant Life of Jeremiah Horrocks, Father of British Astronomy, Orion, 2004, 0-297-84721-x, £18.99.