Components of error of maps from remotely sensed images

The concept of a “true” ground-truth map is introduced, from which the inaccuracy/error of any production map may be measured. A partition of the mapped region is defined in terms of the “residual rectification” transformation. Geometric RMS-type and Geometric Distortion error criteria are defined as well as a map mis-classification error criterion (the latter for hard and fuzzy produc-tion maps). The total map error is defined to be the sum (over each set of the map partition men-tioned above) of these three error components integrated over each set of the partition.

Surface physics at the nano-scale via scanning probe microscopy and molecular dynamics simulations

Probe-based scanning microscopes, such as the STM and the AFM, are used to obtain the topographical and electronic structure maps of material surfaces, and to modify their morphologies on nanoscopic scales. They have generated new areas of research in condensed matter physics and materials science. We will review some examples from the fields of experimental nano-mechanics, nano-electronics and nano-magnetism. These now form the basis of the emerging field of Nano-technology. A parallel development has been brought about in the field of Computational Nano-science, using quantum-mechanical techniques and computer-based numerical modelling, such as the Molecular Dynamics (MD) simulation method. We will report on the simulation of nucleation and growth of nano-phase films on supporting substrates. Furthermore, a theoretical modelling of the formation of STM images of metallic clusters on metallic substrates will also be discussed within the non-equilibrium Keldysh Green function method to study the effects of coherent tunnelling through different atomic orbitals in a tip-sample geometry.