2 resultados para Optical Properties and Phenomena.
em DigitalCommons@University of Nebraska - Lincoln
Resumo:
Variable angle of incidence spectroscopic ellipsometry was used to determine the optical constants near the band edge of boron carbide (B5C) thin films deposited on glass and n-type Si(111) via plasma-enhanced chemical-vapor deposition. The index of refraction n, the extinction coefficient k, and the absorption coefficient are reported in the photon energy spectrum between 1.24 and 4 eV. Ellipsometry analysis of B5C films on silicon indicates a graded material, while the optical constants of B5C on glass are homogeneous. Line shape analyses of absorption data for the films on glass indicate an indirect transition at approximately 0.75 eV and a direct transition at about 1.5 eV. ©1996 American Institute of Physics.
Resumo:
An analytical model for Virtual Topology Reconfiguration (VTR) in optical networks is developed. It aims at the optical networks with a circuit-based data plane and an IPlike control plane. By identifying and analyzing the important factors impacting the network performance due to VTR operations on both planes, we can compare the benefits and penalties of different VTR algorithms and policies. The best VTR scenario can be adaptively chosen from a set of such algorithms and policies according to the real-time network situations. For this purpose, a cost model integrating all these factors is created to provide a comparison criterion independent of any specific VTR algorithm and policy. A case study based on simulation experiments is conducted to illustrate the application of our models.