1 resultado para X-ray anomalous scattering
em Boston University Digital Common
Resumo:
Material discrimination based on conventional or dual energy X-ray computed tomography (CT) imaging can be ambiguous. X-ray diffraction imaging (XDI) can be used to construct diffraction profiles of objects, providing new molecular signature information that can be used to characterize the presence of specific materials. Combining X-ray CT and diffraction imaging can lead to enhanced detection and identification of explosives in luggage screening. In this work we are investigating techniques for joint reconstruction of CT absorption and X-ray diffraction profile images of objects to achieve improved image quality and enhanced material classification. The initial results have been validated via simulation of X-ray absorption and coherent scattering in 2 dimensions.