1 resultado para EQUIVALENT LAYERS
em Aberystwyth University Repository - Reino Unido
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Relevância:
Resumo:
Jenkins, Tudor; Hayton, D.J.; Bailey, P.; Noakes, T.C.Q., (2002) 'Optical and ion-scattering study of SiO2 layers thermally grown on 4H-SiC', Semiconductor Science and Technology 17 pp.L29-L32 RAE2008
