Simplified Chinese lacquer techniques and Nanban style decoration on Luso-Asian objects from the late sixteenth or early seventeenth centuries

The meeting of multiple cultures and their mutual influence during the Portuguese expansion in Asia led to the emergence of different types of fusion styles in objects commissioned by the settlers, merchants, and religious orders present in Portuguese India. The east-Asian lacquer coatings of modestly sized wooden objects of various types dating from the sixteenth and early seventeenth centuries have been analyzed as part of the research for a doctoral thesis that aims to establish their cultural and geographical attribution within the context of the Getty Conservation Institute’s lacquer research project. Among the objects were three seventeenthcentury lacquered trays from Portuguese museums and private collections that had previously been classified as Japanese Nanban, Chinese or Ryukyuan lacquers or even as Indo-Portuguese artifacts. The materials and techniques that were identified show close similarities with Chinese techniques mentioned in historic accounts — the only existing Ming Chinese Treatise on lacquering Xiushi lu and the eighteenth-century memoirs of the Jesuit priest d’Incarville. These nearly 400-year-old artifacts are among the first lacquered objects commissioned by Europeans and probably the first of Chinese origin. Their detailed technical study contributes to international lacquer research and complements existing knowledge and perceptions of the lacquering processes that were applied in response to an early European demand for exotic items.

Comparison of Photovoltaic panel’s standard and simplified models

Shockley diode equation is basic for single diode model equation, which is overly used for characterizing the photovoltaic cell output and behavior. In the standard equation, it includes series resistance (Rs) and shunt resistance (Rsh) with different types of parameters. Maximum simulation and modeling work done previously, related to single diode photovoltaic cell used this equation. However, there is another form of the standard equation which has not included Series Resistance (Rs) and Shunt Resistance (Rsh) yet, as the Shunt Resistance is much bigger than the load resistance and the load resistance is much bigger than the Series Resistance. For this phenomena, very small power loss occurs within a photovoltaic cell. This research focuses on the comparison of two forms of basic Shockley diode equation. This analysis describes a deep understanding of the photovoltaic cell, as well as gives understanding about Series Resistance (Rs) and Shunt Resistance (Rsh) behavior in the Photovoltaic cell. For making estimation of a real time photovoltaic system, faster calculation is needed. The equation without Series Resistance and Shunt Resistance is appropriate for the real time environment. Error function for both Series resistance (Rs) and Shunt resistances (Rsh) have been analyzed which shows that the total system is not affected by this two parameters' behavior.