Adventitious rooting of conifers: influence of biological factors

Vegetative propagation of superior conifer trees can be achieved e.g. through rooted cuttings or rooted microshoots, the latter predominantly through in vitro tissue culture. Both techniques are used to achieve rapid multiplication of trees with favorable genetic combinations and to capture a large proportion of the genetic diversity in a single generation cycle. However, adventitious rooting of shoots (cuttings) is often not efficient due to various problems such as scarcity of roots and cessation of their growth, both of which limit the application of vegetative propagation in some conifer species. Many factors are involved in the adventitious rooting of shoots including physical and chemical ones such as plant growth regulators, carbohydrates, light quality, temperature and rooting substrates or media (reviewed by Ragonezi et al. 2010). The focus of this review is on biological factors, such as inoculations with Agrobacterium rhizogenes, plant- growth-promoting rhizobacteria and other endophytes, and mycorrhizal fungi, which were found to stimulate adventitious rooting. These microorganisms could contribute not only to adventitious root development but also help in protecting conifer plants against pathogenic microorganisms, facilitate acclimation and transplanting, and contribute to more sustainable, chemical-free forests.

Uncertainty evaluation of multivariate quantities: A case study on electrical impedance

The paper discusses the evaluation of the uncertainty of a multivariate quantity using the Law of Propagation of Uncertainty defined in the Guide to the Expression of Uncertainty in Measurement (GUM) and a Monte Carlo method according to the GUM’s Supplement 2. The quantity analysed is the electrical impedance, which is not a scalar but a complex quantity. The used measuring method allows the evaluation of the impedance and of its uncertainty in different ways and the corresponding results are presented, compared and discussed. For comparison purposes, results of the impedance uncertainty obtained using the NIST Uncertainty Machine are also presented.