Electric field strengths and ion trajectories in sharp-edge field ionization sources

On the presumption that a sharp edge may be represented by a hyperbola, a conformal transformation method is used to derive electric field equations for a sharp edge suspended above a flat plate. A further transformation is then introduced to give electric field components for a sharp edge suspended above a thin slit. Expressions are deduced for the field strength at the vertex of the edge in both arrangements. The calculated electric field components are used to compute ion trajectories in the simple edge/flat-plate case. The results are considered in relation to future study of ion focusing and unimolecular decomposition of ions in field ionization mass spectrometers.