Structural and optical investigations of TiO2 films deposited on transparent substrates by sol-gel technique

An inexpensive and effective simple method for the preparation of nano-crystalline titanium oxide (anatase) thin films at room temperature on different transparent substrates is presented. This method is based on the use of peroxo-titanium complex, i.e. titanium isopropoxide as a single initiating organic precursor. Post-annealing treatment is necessary to convert the deposited amorphous film into titanium oxide (TiO2) crystalline (anatase) phase. These films have been characterized for X-ray diffraction (XRD) studies, atomic force microscopic (AFM) studies and optical measurements. The optical constants such as refractive index and extinction coefficient have been estimated by using envelope technique. Also, the energy gap values have been estimated using Tauc's formula for on glass and quartz substrates are found to be 3.35 eV and 3.39 eV, respectively.

Structural and optical investigations of TiO2 films deposited on transparent substrates by sol-gel technique

An inexpensive and effective simple method for the preparation of nano-crystalline titanium oxide (anatase) thin films at room temperature on different transparent substrates is presented. This method is based on the use of peroxo-titanium complex, i.e. titanium isopropoxide as a single initiating organic precursor. Post-annealing treatment is necessary to convert the deposited amorphous film into titanium oxide (TiO2) crystalline (anatase) phase. These films have been characterized for X-ray diffraction (XRD) studies, atomic force microscopic (AFM) studies and optical measurements. The optical constants such as refractive index and extinction coefficient have been estimated by using envelope technique. Also, the energy gap values have been estimated using Tauc's formula for on glass and quartz substrates are found to be 3.35 eV and 3.39 eV, respectively. (C) 2008 Elsevier B.V. All rights reserved.

Re-examination of one-point methods of liquid limit determination

This Paper deals with the analysis of liquid limit of soils, an inferential parameter of universal acceptance. It has been undertaken primarily to re-examine one-point methods of determination of liquid limit water contents. It has been shown by basic characteristics of soils and associated physico-chemical factors that critical shear strengths at liquid limit water contents arise out of force field equilibrium and are independent of soil type. This leads to the formation of a scientific base for liquid limit determination by one-point methods, which hitherto was formulated purely on statistical analysis of data. Available methods (Norman, 1959; Karlsson, 1961; Clayton & Jukes, 1978) of one-point liquid limit determination have been critically re-examined. A simple one-point cone penetrometer method of computing liquid limit has been suggested and compared with other methods. Experimental data of Sherwood & Ryley (1970) have been employed for comparison of different cone penetration methods. Results indicate that, apart from mere statistical considerations, one-point methods have a strong scientific base on the uniqueness of modified flow line irrespective of soil type. Normalized flow line is obtained by normalization of water contents by liquid limit values thereby nullifying the effects of surface areas and associated physico-chemical factors that are otherwise reflected in different responses at macrolevel.Cet article traite de l'analyse de la limite de liquidité des sols, paramètre déductif universellement accepté. Cette analyse a été entreprise en premier lieu pour ré-examiner les méthodes à un point destinées à la détermination de la teneur en eau à la limite de liquidité. Il a été démontré par les caractéristiques fondamentales de sols et par des facteurs physico-chimiques associés que les résistances critiques à la rupture au cisaillement pour des teneurs en eau à la limite de liquidité résultent de l'équilibre des champs de forces et sont indépendantes du type de sol concerné. On peut donc constituer une base scientifique pour la détermination de la limite de liquidité par des méthodes à un point lesquelles, jusqu'alors, n'avaient été formulées que sur la base d'une analyse statistique des données. Les méthodes dont on dispose (Norman, 1959; Karlsson, 1961; Clayton & Jukes, 1978) pour la détermination de la limite de liquidité à un point font l'objet d'un ré-examen critique. Une simple méthode d'analyse à un point à l'aide d'un pénétromètre à cône pour le calcul de la limite de liquidité a été suggérée et comparée à d'autres méthodes. Les données expérimentales de Sherwood & Ryley (1970) ont été utilisées en vue de comparer différentes méthodes de pénétration par cône. En plus de considérations d'ordre purement statistque, les résultats montrent que les méthodes de détermination à un point constituent une base scientifique solide en raison du caractère unique de la ligne de courant modifiée, quel que soit le type de sol La ligne de courant normalisée est obtenue par la normalisation de la teneur en eau en faisant appel à des valeurs de limite de liquidité pour, de cette manière, annuler les effets des surfaces et des facteurs physico-chimiques associés qui sans cela se manifesteraient dans les différentes réponses au niveau macro.

Optical, dielectric and morphological studies of sol-gel derived nanocrystalline TiO2 films

Nanocrystalline TiO2 films have been synthesized on glass and silicon substrates by sol-gel technique. The films have been characterized with optical reflectance/transmittance in the wavelength range 300-1000nm and the optical constants (n, k) were estimated by using envelope technique as well as spectroscopic ellipsometry. Morphological studies have been carried Out using atomic force microscope (AFM). Metal-Oxide-Silicon (MOS) capacitor was fabricated using conducting coating on TiO2 film deposited on silicon. The C-V measurements show that the film annealed at 300 degrees C has a dielectric constant of 19.80. The high percentage of transmittance, low surface roughness and high dielectric constant suggests that it can be used as an efficient anti-reflection coating on silicon and other optical coating applications and also as a MOS capacitor.

Sol-Gel Synthesis, characterization and optical properties of Tio2 thin films deposited on ITO/Glass substrates

TiO2 thin films have been deposited on glass and indium tin oxide (ITO) coated glass substrates by sol-gel technique. the influence of annealing temperature on the structural , morphological and optical properties has been examined. X-ray diffraction (XRD) results reveal the amorphous nature of the as-deposited film whereas the annealed films are found to be in the crystalline anatase phase. The surface morphology of the films at different annealing temperatures has been examined by atomic force microscopy (AFM). The in situ surface morphology of the as-deposited and annealed TiO2 films has also been examined by optical polaromicrograph (OPM). TiO2 films infatuated different structural and surface features with variation of annealing temperature. The optical studies on these films suggest their possible usage in sun-shielding applications.

Structural, dielectric and ferroelectric properties of multilayer lithium tantalate thin films prepared by sol-gel technique

Multilayer lithium tantalate thin films were deposited on Pt-Si Si(111)/SiO2/TiO2/Pt(111)]substrates by sol-gel process. The films were annealed at different annealing temperatures (300, 450 and 650 degrees C) for 15 min. The films are polycrystalline at 650 degrees C and at other annealing conditions below 650 degrees C the films are in amorphous state. The films were characterized using X-ray diffraction, atomic force microscopy (AFM) and Raman spectroscopy. The AFM of images show the formation of nanograins of uniform size (50 nm) at 650 degrees C. These polycrystalline films exhibit spontaneous polarization of 1.5 mu C/cm(2) at an application of 100 kV/cm. The dielectric constant of multilayer film is very small (6.4 at 10 kHz) as compared to that of single crystal. (C) 2010 Elsevier B.V. All rights reserved.