Drift parameters optimization of a TPC polarimeter: a simulation study

Time Projection Chamber (TPC) based X-ray polarimeters using Gas Electron Multiplier (GEM) are currently being developed to make sensitive measurement of polarization in 2-10 keV energy range. The emission direction of the photoelectron ejected via photoelectric effect carries the information of the polarization of the incident X-ray photon. Performance of a gas based polarimeter is affected by the operating drift parameters such as gas pressure, drift field and drift-gap. We present simulation studies carried out in order to understand the effect of these operating parameters on the modulation factor of a TPC polarimeter. Models of Garfield are used to study photoelectron interaction in gas and drift of electron cloud towards GEM. Our study is aimed at achieving higher modulation factors by optimizing drift parameters. Study has shown that Ne/DME (50/50) at lower pressure and drift field can lead to desired performance of a TPC polarimeter.

Effects of Patterned Substrate on Thin Films Simulated by Family Model

Patterned substrate growth has been a subject of much interest. In this work, characteristics of some statistical properties of a film grown on triangular and vicinal substrates using the Family model are studied. Substrate size and tilt angle are varied. It is found that the interface width and the correlation function increase as the roughness of the pattern is increased. The new scaling exponents are calculated and anomalous scaling is obtained. The transient persistence probability does not show a power law relation when the initial surface is sufficiently rough. The initial rough surface also causes multifractal behavior in the model.