Optimization of clamped beam geometry for fracture toughness testing of micron-scale samples

Fracture toughness measurements at the small scale have gained prominence over the years due to the continuing miniaturization of structural systems. Measurements carried out on bulk materials cannot be extrapolated to smaller length scales either due to the complexity of the microstructure or due to the size and geometric effect. Many new geometries have been proposed for fracture property measurements at small-length scales depending on the material behaviour and the type of device used in service. In situ testing provides the necessary environment to observe fracture at these length scales so as to determine the actual failure mechanism in these systems. In this paper, several improvements are incorporated to a previously proposed geometry of bending a doubly clamped beam for fracture toughness measurements. Both monotonic and cyclic loading conditions have been imposed on the beam to study R-curve and fatigue effects. In addition to the advantages that in situ SEM-based testing offers in such tests, FEM has been used as a simulation tool to replace cumbersome and expensive experiments to optimize the geometry. A description of all the improvements made to this specific geometry of clamped beam bending to make a variety of fracture property measurements is given in this paper.

Dynamic range tuning of graphene nanoresonators

From sensing perspective, smaller electromechanical devices, in general, are expected to be more responsive to the stimuli. This enhanced performance, however, is contingent upon the noise sources remaining unchanged and the onset of nonlinear behavior not being precipitated by miniaturization. In this paper, we study the effect of strain on the nonlinearities and dynamic range in graphene nanoresonators. The dynamic response and the onset of nonlinearity in these devices are sensitive both to the electrostatic field used to actuate the device and the strain. By tuning the strain of the device by two orders of magnitude, we observe an enhancement of 25 dB in the dynamic range leading to a mass resolution of 100 yoctogram. The increase in dynamic range in our devices is modeled as a combined effect of strain and partial cancellation of elastic and electrostatic nonlinearities. (C) 2015 AIP Publishing LLC.