Strain field measurement using digital image correlation

Digital Image Correlation and Tracking (DIC/DDIT) is an optical method that employs tracking & image registration techniques for accurate 2D and 3D measurements of changes in images. This is often used to measure deformation (engineering), displacement, and strain, but it is widely applied in many areas of science and engineering. One very common application is for measuring the motion of an optical mouse.

Effect of strain path change on the evolution of texture and microstructure during rolling of copper and nickel

The effect of strain path change during rolling has been investigated for copper and nickel using X-ray diffraction and electron back scatter diffraction as well as crystal plasticity simulations. Four different strain paths namely: (i) unidirectional rolling; (ii) reverse rolling; (iii) two-step cross rolling and (iv) multi-step cross rolling were employed to decipher the effect of strain path change on the evolution of deformation texture and microstructure. The cross rolled samples showed weaker texture with a prominent Bs {1 1 0}< 1 1 2 > and P(B(ND)) {1 1 0}< 1 1 1 > component in contrast to the unidirectional and reverse rolled samples where strong S {1 2 3}< 6 3 4 > and Cu {1 1 2}< 1 1 1 > components were formed. This was more pronounced for copper samples compared to nickel. The cross rolled samples were characterized by lower anisotropy and Taylor factor as well as less variation in Lankford parameter. Viscoplastic self-consistent simulations indicated that slip activity on higher number of octahedral slip systems can explain the weaker texture as well as reduced anisotropy in the cross rolled samples. (C) 2011 Elsevier B.V. All rights reserved.

The phenomenon of notch in an NEMP simulator and its reduction

The effect of variation in the switching instant of the output switch of the pulser circuit used in energizing an NEMP simulator on the voltage fed to the simulator and hence the electric field within the working volume of the simulator has been studied. Depending upon the instant at which the output switch closes, the amplitude and the wave shape of the voltage that is fed to the illuminator varies. This wave shape of the output voltage from the pulser circuit determines the shape and characteristics of the electric field within the working volume of the simulator. To study the effect of variation in the switching instant on the vertical electric field within the working volume, the vertical electric field has been computed in time and frequency domains. For certain switching instants, the electric field shows a sharp reduction in its amplitude after the peak which is called the notch. The presence of notch results in the test object not getting illuminated with all the frequencies of interest. The notch has been successfully reduced by suitably modifying the pulser circuit.