2 resultados para high-stakes testing

em Illinois Digital Environment for Access to Learning and Scholarship Repository


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This study positioned the federal No Child Left Behind (NCLB) Act of 2002 as a reified colonizing entity, inscribing its hegemonic authority upon the professional identity and work of school principals within their school communities of practice. Pressure on educators and students intensifies each year as the benchmark for Adequate Yearly Progress under the NCLB policy is raised, resulting in standards-based reform, scripted curriculum and pedagogy, absence of elective subjects, and a general lack of autonomy critical to the work of teachers as they approach each unique class and student (Crocco & Costigan, 2007; Mabry & Margolis, 2006). Emphasis on high stakes standardized testing as the indicator for student achievement (Popham, 2005) affects educators’ professional identity through dramatic pedagological and structural changes in schools (Day, Flores, & Viana, 2007). These dramatic changes to the ways our nation conducts schooling must be understood and thought about critically from school leaders’ perspectives as their professional identity is influenced by large scale NCLB school reform. The author explored the impact No Child Left Behind reform had on the professional identity of fourteen, veteran Illinois principals leading in urban, small urban, suburban, and rural middle and elementary schools. Qualitative data were collected during semi-structured interviews and focus groups and analyzed using a dual theoretical framework of postcolonial and identity theories. Postcolonial theory provided a lens from which the author applied a metaphor of colonization to principals’ experiences as colonized-colonizers in a time of school reform. Principal interview data illustrated many examples of NCLB as a colonizing authority having a significant impact on the professional identity of school leaders. This framework was used to interpret data in a unique and alternative way and contributed to the need to better understand the ways school leaders respond to district-level, state-level, and national-level accountability policies (Sloan, 2000). Identity theory situated principals as professionals shaped by the communities of practice in which they lead. Principals’ professional identity has become more data-driven as a result of NCLB and their role as instructional leaders has intensified. The data showed that NCLB has changed the work and professional identity of principals in terms of use of data, classroom instruction, Response to Intervention, and staffing changes. Although NCLB defines success in terms of meeting or exceeding the benchmark for Adequate Yearly Progress, principals’ view AYP as only one measurement of their success. The need to meet the benchmark for AYP is a present reality that necessitates school-wide attention to reading and math achievement. At this time, principals leading in affluent, somewhat homogeneous schools typically experience less pressure and more power under NCLB and are more often labeled “successful” school communities. In contrast, principals leading in schools with more heterogeneity experience more pressure and lack of power under NCLB and are more often labeled “failing” school communities. Implications from this study for practitioners and policymakers include a need to reexamine the intents and outcomes of the policy for all school communities, especially in terms of power and voice. Recommendations for policy reform include moving to a growth model with multi-year assessments that make sense for individual students rather than one standardized test score as the measure for achievement. Overall, the study reveals enhancements and constraints NCLB policy has caused in a variety of school contexts, which have affected the professional identity of school leaders.

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Thin film adhesion often determines microelectronic device reliability and it is therefore essential to have experimental techniques that accurately and efficiently characterize it. Laser-induced delamination is a novel technique that uses laser-generated stress waves to load thin films at high strain rates and extract the fracture toughness of the film/substrate interface. The effectiveness of the technique in measuring the interface properties of metallic films has been documented in previous studies. The objective of the current effort is to model the effect of residual stresses on the dynamic delamination of thin films. Residual stresses can be high enough to affect the crack advance and the mode mixity of the delimitation event, and must therefore be adequately modeled to make accurate and repeatable predictions of fracture toughness. The equivalent axial force and bending moment generated by the residual stresses are included in a dynamic, nonlinear finite element model of the delaminating film, and the impact of residual stresses on the final extent of the interfacial crack, the relative contribution of shear failure, and the deformed shape of the delaminated film is studied in detail. Another objective of the study is to develop techniques to address issues related to the testing of polymeric films. These type of films adhere well to silicon and the resulting crack advance is often much smaller than for metallic films, making the extraction of the interface fracture toughness more difficult. The use of an inertial layer which enhances the amount of kinetic energy trapped in the film and thus the crack advance is examined. It is determined that the inertial layer does improve the crack advance, although in a relatively limited fashion. The high interface toughness of polymer films often causes the film to fail cohesively when the crack front leaves the weakly bonded region and enters the strong interface. The use of a tapered pre-crack region that provides a more gradual transition to the strong interface is examined. The tapered triangular pre-crack geometry is found to be effective in reducing the stresses induced thereby making it an attractive option. We conclude by studying the impact of modifying the pre-crack geometry to enable the testing of multiple polymer films.