Dual self-image technique for beam collimation

We propose an accurate technique for obtaining highly collimated beams, which also allows testing the collimation degree of a beam. It is based on comparing the period of two different self-images produced by a single diffraction grating. In this way, variations in the period of the diffraction grating do not affect to the measuring procedure. Self-images are acquired by two CMOS cameras and their periods are determined by fitting the variogram function of the self-images to a cosine function with polynomial envelopes. This way, loss of accuracy caused by imperfections of the measured self-images is avoided. As usual, collimation is obtained by displacing the collimation element with respect to the source along the optical axis. When the period of both self-images coincides, collimation is achieved. With this method neither a strict control of the period of the diffraction grating nor a transverse displacement, required in other techniques, are necessary. As an example, a LED considering paraxial approximation and point source illumination is collimated resulting a resolution in the divergence of the beam of σ φ = ± μrad.

Classifying image analysis techniques from their output

In this paper we discuss some main image processing techniques in order to propose a classification based upon the output these methods provide. Because despite a particular image analysis technique can be supervised or unsupervised, and can allow or not the existence of fuzzy information at some stage, each technique has been usually designed to focus on a specific objective, and their outputs are in fact different according to each objective. Thus, they are in fact different methods. But due to the essential relationship between them they are quite often confused. In particular, this paper pursues a clarification of the differences between image segmentation and edge detection, among other image processing techniques.