A unified model for dislocation nucleation, dislocation emission and dislocation free zone

In this paper, a unified model for dislocation nucleation, emission and dislocation free zone is proposed based on the Peierls framework. Three regions are identified ahead of the crack tip. The emitted dislocations, located away from the crack tip in the form of an inverse pileup, define the plastic zone. Between that zone and the cohesive zone immediately ahead of the crack tip, there is a dislocation free zone. With the stress field and the dislocation density field in the cohesive zone and plastic zone being, respectively, expressed in the first and second Chebyshev polynomial series, and the opening and slip displacements in trigonometric series, a set of nonlinear algebraic equations can be obtained and solved with the Newton-Raphson Method. The results of calculations for pure shearing and combined tension and shear loading after dislocation emission are given in detail. An approximate treatment of the dynamic effects of the dislocation emission is also developed in this paper, and the calculation results are in good agreement with those of molecular dynamics simulations.

Molecular dynamics simulation of interaction of a dislocation array from a crack tip with grain boundaries

The interaction of a dislocation array emitted from a crack tip under mode II loading with asymmetric tilt grain boundaries (GBs) is analysed by the molecular dynamics method. The GBs can generally be described by planar and linear matching zones and unmatching zones. All GBs are observed to emit dislocations. The GBs migrated easily due to their planar and linear matching structure and asymmetrical type. The diffusion induced by stress concentration is found to promote the GB migration. The transmissions of dislocations are either along the matched plane or along another plane depending on tilt angle theta. Alternate processes of stress concentration and stress relaxation take place ahead of the pileup. The stress concentration can be released either by transmission of dislocations, by atom diffusion along GBs, or by migration of GBs by formation of twinning bands. The simulated results also unequivocally demonstrate two processes, i.e. asymmetrical GBs evolving into symmetrical ones and unmatching zones evolving into matching ones during the loading process.

Study of elastic modulus and yield strength of polymer thin films using atomic force microscopy

Nanometer-scale elastic moduli and yield strengths of polycarbonate (PC) and polystyrene (PS) thin films were measured with atomic force microscopy (AFM) indentation measurements. By analysis of the AFM indentation force curves with the method by Oliver and Pharr, Young's moduli of PC and PS thin films could be obtained as 2.2 +/- 0.1 and 2.6 +/- 0.1 GPa, respectively, which agree well with the literature values. By fitting Johnson's conical spherical cavity model to the measured plastic zone sizes, we obtained yield strengths of 141.2 MPa for PC thin films and 178.7 MPa for PS thin films, which are similar to2 times the values expected from the literature. We propose that it is due to the AFM indentation being asymmetric, which was not accounted for in Johnson's model. A correction factor, epsilon, of similar to0.72 was introduced to rescale the plastic zone size, whereupon good agreement between theory and experiment was achieved.

Two modes of dipole events in tropical Indian Ocean

By analyzing the distributions of subsurface temperature and the surface wind stress anomalies in the tropical Pacific and Indian Oceans during the Indian Ocean Dipole (IOD) events, two major modes of the IOD and their formation mechanisms are revealed. (1) The subsurface temperature anomaly (STA) in the tropical Indian Ocean during the IOD events can be described as a "<" -shaped and west-east-oriented dipole pattern; in the east side of the "<" pattern, a notable tongue-like STA extends westward along the equator in the tropical eastern Indian Ocean; while in the west side of the "<" pattern, the STA has opposite sign with two centers (the southern one is stronger than the northern one in intensity) being of rough symmetry about the equator in the tropical mid-western Indian Ocean. (2) The IOD events are composed of two modes, which have similar spatial pattern but different temporal variabilities due to the large scale air-sea interactions within two independent systems. The first mode of the IOD event originates from the air-sea interaction on a scale of the tropical Pacific-Indian Ocean and coexists with ENSO. The second mode originates from the air-sea interaction on a scale of the tropical Indian Ocean and is closely associated with changes in the position and intensity of the Mascarene high pressure. The strong IOD event occurs when the two modes are in phase, and the IOD event weakens or disappears when the two modes are out of phase. Besides, the IOD events are normally strong when either of the two modes is strong. (3) The IOD event is caused by the abnormal wind stress forcing over the tropical Indian Ocean, which results in vertical transports, leading to the upwelling and pileup of seawater. This is the main dynamic processes resulting in the STA. When the anomalous easterly exists over the equatorial Indian Ocean, the cold waters upwell in the tropical eastern Indian Ocean while the warm waters pileup in the tropical western Indian Ocean, hence the thermocline in the tropical Indian Ocean is shallowed in the east and deepened in the west. The off-equator component due to the Coriolis force in the equatorial area causes the upwelling of cold waters and the shallowing of the equatorial India Ocean thermocline. On the other hand, the anomalous anticyclonic circulations and their curl fields located on both sides of the equator, cause the pileup of warm waters in the central area of their curl fields and the deepening of the equatorial Indian Ocean thermocline off the equator. The above three factors lead to the occurrence of positive phase IOD events. When anomalous westerly dominates over the tropical Indian Ocean, the dynamic processes are reversed, and the negative-phase IOD event occurs.