Extracting nanobelt mechanical properties from nanoindentation

A three-spring-in-series model is proposed for the nanobelt (NB) indentation test. Compared with the previous two-spring-in-series model, which considers the bending stiffness of atomic force microscope cantilever and the indenter/NB contact stiffness, this model adds a third spring of the NB/substrate contact stiffness. NB is highly flexural due to its large aspect ratio of length to thickness. The bending and lift-off of NB form a localized contact with substrate, which makes the Oliver-Pharr method [W. C. Oliver and G. M. Pharr, J. Mater. Res. 7, 1564 (1992)] and Sneddon method [I. N. Sneddon, Int. J. Eng. Sci. 3, 47 (1965)] inappropriate for NB indentation test. Because the NB/substrate deformation may have significant impact on the force-indentation depth data obtained in experiment, the two-spring-in-series model can lead to erroneous predictions on the NB mechanical properties. NB in indentation test can be susceptible to the adhesion influence because of its large surface area to volume ratio. NB/substrate contact and adhesion can have direct and significant impact on the interpretation of experimental data. Through the three-spring-in-series model, the influence of NB/substrate contact and adhesion is analyzed and methods of reducing such influence are also suggested. (C) 2010 American Institute of Physics. [doi:10.1063/1.3432748]

土壤持水特征测定中质量含水量、吸力和容重三者间定量关系I.填装土壤

在试验过程中,通常采用一个土样进行连续试验来测定土壤的持水特征。此时,土样的有机质、黏粒矿物类型和阳离子交换量等性质基本保持不变,而土壤的容重在水力学和机械压力共同作用下会发生很大的变化。因此,我们认为实测的土壤持水特征不再是土壤吸力和含水量相对应的一条曲线,而是由土壤质量含水量、吸力和容重三变量共同确定的一个曲面。本文在Brooks-Corey土壤水分特征曲线模型的基础上,提出了两种描述土壤质量含水量、吸力和容重三变量关系的曲面模型,分析了模型的优缺点和适用条件,并采用离心机石蜡控容重法实测了四种质地填装土壤的三变量特征曲面。研究结果表明:土壤持水特征是由土壤质量含水量、吸力和容重三变量共同确定的一个曲面这一假设是合理的;类似于Brooks-Corey模型的两种幂函数经验曲面模型能够合理地描述填装土壤的实测数据,决定系数均大于0.94;模型Ⅰ的拟合效果略好于模型Ⅱ,但模型Ⅱ包含两个物理意义明确的参数,具有一定的优势。这一研究将为校正容重变化对土壤水力学参数的影响提供新的途径。

Ultrathin-film growth of para-sexiphenyl (I): Submonolayer thin-film growth as a function of the substrate temperature

The para-sexiphenyl (p-6P) monolayer film induces weak epitaxy growth (WEG) of disk-like organic semiconductors, and their charge mobilities are increased dramatically to the level of the corresponding single crystals [Wang et al., Adv. Mater. 2007, 19, 2168]. The growth behavior and morphology of p-6P monolayer film play decisive roles on WEG. Here, we investigated the growth behavior of p-6P submonolayer film as a function of the substrate temperature. Its growth exhibited two different mechanisms at high and low substrate temperature.

Reduction from Eu3+ to Eu2+ in BaAl2O4 : Eu phosphor prepared in an oxidizing atmosphere and luminescent properties of BaAl2O4 : Eu

A reduction phenomenon of Eu3+ -> Eu2+ was observed for the first time when Eu3+ ions were doped into an AlO4-tetrahedron-containing compound BaAl2O4 in an oxidizing atmosphere of air by high-temperature solid-state reaction. X-ray powder diffraction patterns and photoluminescent spectra are used to confirm the compound structure and detect the simultaneous existence of both divalent and trivalent europium ions, respectively. The abnormal Eu3+ -> Eu2+ reduction is explained by a charge compensation model. Spectroscopic properties of BaAl2O4:Eu are discussed and Eu2+ emission spectrum shows consistence with the results reported by Katsumata et a]. [J. Cryst. Growth 198/199 (1999) 869.] and Lin et al. [Mater. Chem. Phys. 70 (2001) 156.].